On the mean and extreme distances between failures in Markovian binary sequences
| dc.authorid | Yalcin, Femin/0000-0003-0602-9392 | |
| dc.authorid | Eryilmaz, Serkan/0000-0002-2108-1781 | |
| dc.authorscopusid | 8203625300 | |
| dc.authorscopusid | 37050274700 | |
| dc.authorwosid | Eryilmaz, Serkan/AAF-9349-2019 | |
| dc.authorwosid | Yalcin, Femin/N-9138-2015 | |
| dc.contributor.author | Eryilmaz, Serkan | |
| dc.contributor.author | Yalcin, Femin | |
| dc.contributor.other | Industrial Engineering | |
| dc.date.accessioned | 2024-07-05T15:10:34Z | |
| dc.date.available | 2024-07-05T15:10:34Z | |
| dc.date.issued | 2011 | |
| dc.department | Atılım University | en_US |
| dc.department-temp | [Eryilmaz, Serkan] Atilim Univ, Dept Ind Engn, TR-06836 Ankara, Turkey; [Yalcin, Femin] Izmir Univ Econ, Dept Math, TR-35330 Izmir, Turkey | en_US |
| dc.description | Yalcin, Femin/0000-0003-0602-9392; Eryilmaz, Serkan/0000-0002-2108-1781 | en_US |
| dc.description.abstract | This paper is concerned with the mean, minimum and maximum distances between two successive failures in a binary sequence consisting of Markov dependent elements. These random variables are potentially useful for the analysis of the frequency of critical events occurring in certain stochastic processes. Exact distributions of these random variables are derived via combinatorial techniques and illustrative numerical results are presented. (C) 2011 Elsevier B.V. All rights reserved. | en_US |
| dc.identifier.citation | 5 | |
| dc.identifier.doi | 10.1016/j.cam.2011.09.013 | |
| dc.identifier.endpage | 1510 | en_US |
| dc.identifier.issn | 0377-0427 | |
| dc.identifier.issue | 6 | en_US |
| dc.identifier.scopus | 2-s2.0-80955130703 | |
| dc.identifier.startpage | 1502 | en_US |
| dc.identifier.uri | https://doi.org/10.1016/j.cam.2011.09.013 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14411/1337 | |
| dc.identifier.volume | 236 | en_US |
| dc.identifier.wos | WOS:000298271800037 | |
| dc.identifier.wosquality | Q1 | |
| dc.institutionauthor | Eryılmaz, Serkan | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier Science Bv | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | Binary sequence | en_US |
| dc.subject | Exact distribution | en_US |
| dc.subject | Extremes | en_US |
| dc.subject | Markov chain | en_US |
| dc.subject | System reliability | en_US |
| dc.title | On the mean and extreme distances between failures in Markovian binary sequences | en_US |
| dc.type | Article | en_US |
| dspace.entity.type | Publication | |
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