Temperature-dependent material characterization of CuZnSe<sub>2</sub> thin films

dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorid SURUCU, Özge/0000-0002-8478-1267
dc.authorid parlak, mehmet/0000-0001-9542-5121
dc.authorid Terlemezoglu, Makbule/0000-0001-7912-0176
dc.authorid Isik, Mehmet/0000-0003-2119-8266
dc.authorid Gullu, Hasan Huseyin/0000-0001-8541-5309
dc.authorscopusid 36766075800
dc.authorscopusid 57222350312
dc.authorscopusid 57193666915
dc.authorscopusid 23766993100
dc.authorscopusid 6602475990
dc.authorscopusid 35580905900
dc.authorscopusid 35580905900
dc.authorwosid Gasanly, Nizami/HRE-1447-2023
dc.authorwosid Gasanly, Nizami/ABA-2249-2020
dc.authorwosid SURUCU, Özge/ABA-4839-2020
dc.authorwosid Isik, Mehmet/KMY-5305-2024
dc.authorwosid Erçelebi, Çiğdem/ABB-8650-2020
dc.authorwosid parlak, mehmet/ABB-8651-2020
dc.authorwosid Gullu, Hasan Huseyin/F-7486-2019
dc.contributor.author Gullu, H. H.
dc.contributor.author Surucu, O.
dc.contributor.author Terlemezoglu, M.
dc.contributor.author Isik, M.
dc.contributor.author Ercelebi, C.
dc.contributor.author Gasanly, N. M.
dc.contributor.author Parlak, M.
dc.contributor.other Electrical-Electronics Engineering
dc.contributor.other Department of Electrical & Electronics Engineering
dc.date.accessioned 2024-07-05T15:38:40Z
dc.date.available 2024-07-05T15:38:40Z
dc.date.issued 2020
dc.department Atılım University en_US
dc.department-temp [Gullu, H. H.; Surucu, O.; Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Terlemezoglu, M.; Ercelebi, C.; Parlak, M.] Middle East Tech Univ, Ctr Solar Energy Res & Applicat GUNAM, TR-06800 Ankara, Turkey; [Terlemezoglu, M.; Ercelebi, C.; Gasanly, N. M.; Parlak, M.] Middle East Tech Univ, Dept Phys, TR-06800 Ankara, Turkey; [Terlemezoglu, M.] Tekirdag Namik Kemal Univ, Dept Phys, TR-59030 Tekirdag, Turkey; [Gasanly, N. M.] Baku State Univ, Virtual Int Sci Res Ctr, Baku 1148, Azerbaijan en_US
dc.description Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; SURUCU, Özge/0000-0002-8478-1267; parlak, mehmet/0000-0001-9542-5121; Terlemezoglu, Makbule/0000-0001-7912-0176; Isik, Mehmet/0000-0003-2119-8266; Gullu, Hasan Huseyin/0000-0001-8541-5309 en_US
dc.description.abstract In the present work, CuZnSe2 (CZSe) thin films were co-deposited by magnetron sputtering of ZnSe and Cu targets. The structural analyses resulted in the stoichiometric elemental composition and polycrystalline nature without secondary phase contribution in the film structure. Optical and electrical properties of CZSe thin films were investigated using temperature-dependent optical transmission and electrical conductivity measurements. The band gap energy values were obtained using transmittance spectra under the light of expression relating absorption coefficient to incident photon energy. Band gap energy values were found in decreasing behavior from 2.31 to 2.27 eV with increase in temperature from 10 to 300 K. Temperature-band gap dependency was evaluated by Varshni and O'Donnell models to detail the optical parameters of the thin films. The experimental dark and photoconductivity values were investigated by thermionic emission model over the grain boundary potential. Room temperature conductivity values were obtained in between 0.91 and 4.65 ( x 10(-4) Omega(-1)cm(-1)) under various illumination intensities. Three different linear conductivity regions were observed in the temperature dependent profile. These linear regions were analyzed to extract the activation energy values. en_US
dc.description.sponsorship Middle East Technical University [METU-GAP-105-2018-2755] en_US
dc.description.sponsorship This work was financed by Middle East Technical University under Grant No. METU-GAP-105-2018-2755. en_US
dc.identifier.citationcount 4
dc.identifier.doi 10.1016/j.tsf.2020.137941
dc.identifier.issn 0040-6090
dc.identifier.scopus 2-s2.0-85081653739
dc.identifier.uri https://doi.org/10.1016/j.tsf.2020.137941
dc.identifier.uri https://hdl.handle.net/20.500.14411/3138
dc.identifier.volume 701 en_US
dc.identifier.wos WOS:000525745900021
dc.identifier.wosquality Q3
dc.institutionauthor Sürücü, Özge
dc.institutionauthor Işık, Mehmet
dc.institutionauthor Güllü, Hasan Hüseyin
dc.language.iso en en_US
dc.publisher Elsevier Science Sa en_US
dc.relation.ispartof 46th International Conference on Metallurgical Coatings and Thin Films (ICMCTF) -- MAY 19-24, 2019 -- San Diego, CA en_US
dc.relation.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 3
dc.subject Thin film en_US
dc.subject Temperature effect en_US
dc.subject Optical properties en_US
dc.subject Photoconductivity en_US
dc.title Temperature-dependent material characterization of CuZnSe<sub>2</sub> thin films en_US
dc.type Conference Object en_US
dc.wos.citedbyCount 4
dspace.entity.type Publication
relation.isAuthorOfPublication 160a7fb2-105b-4b0a-baea-d928bcfab730
relation.isAuthorOfPublication 0493a5b0-644f-4893-9f39-87538d8d6709
relation.isAuthorOfPublication d69999a1-fdfb-496f-8b4e-a9fa9b68b35a
relation.isAuthorOfPublication.latestForDiscovery 160a7fb2-105b-4b0a-baea-d928bcfab730
relation.isOrgUnitOfPublication 032f8aca-54a7-476c-b399-6f26feb20a7d
relation.isOrgUnitOfPublication c3c9b34a-b165-4cd6-8959-dc25e91e206b
relation.isOrgUnitOfPublication.latestForDiscovery 032f8aca-54a7-476c-b399-6f26feb20a7d

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