Temperature-dependent material characterization of CuZnSe<sub>2</sub> thin films

dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridSURUCU, Özge/0000-0002-8478-1267
dc.authoridparlak, mehmet/0000-0001-9542-5121
dc.authoridTerlemezoglu, Makbule/0000-0001-7912-0176
dc.authoridIsik, Mehmet/0000-0003-2119-8266
dc.authoridGullu, Hasan Huseyin/0000-0001-8541-5309
dc.authorscopusid36766075800
dc.authorscopusid57222350312
dc.authorscopusid57193666915
dc.authorscopusid23766993100
dc.authorscopusid6602475990
dc.authorscopusid35580905900
dc.authorscopusid35580905900
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.authorwosidSURUCU, Özge/ABA-4839-2020
dc.authorwosidIsik, Mehmet/KMY-5305-2024
dc.authorwosidErçelebi, Çiğdem/ABB-8650-2020
dc.authorwosidparlak, mehmet/ABB-8651-2020
dc.authorwosidGullu, Hasan Huseyin/F-7486-2019
dc.contributor.authorSürücü, Özge
dc.contributor.authorSurucu, O.
dc.contributor.authorIşık, Mehmet
dc.contributor.authorIsik, M.
dc.contributor.authorGüllü, Hasan Hüseyin
dc.contributor.authorGasanly, N. M.
dc.contributor.authorParlak, M.
dc.contributor.otherElectrical-Electronics Engineering
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T15:38:40Z
dc.date.available2024-07-05T15:38:40Z
dc.date.issued2020
dc.departmentAtılım Universityen_US
dc.department-temp[Gullu, H. H.; Surucu, O.; Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Terlemezoglu, M.; Ercelebi, C.; Parlak, M.] Middle East Tech Univ, Ctr Solar Energy Res & Applicat GUNAM, TR-06800 Ankara, Turkey; [Terlemezoglu, M.; Ercelebi, C.; Gasanly, N. M.; Parlak, M.] Middle East Tech Univ, Dept Phys, TR-06800 Ankara, Turkey; [Terlemezoglu, M.] Tekirdag Namik Kemal Univ, Dept Phys, TR-59030 Tekirdag, Turkey; [Gasanly, N. M.] Baku State Univ, Virtual Int Sci Res Ctr, Baku 1148, Azerbaijanen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; SURUCU, Özge/0000-0002-8478-1267; parlak, mehmet/0000-0001-9542-5121; Terlemezoglu, Makbule/0000-0001-7912-0176; Isik, Mehmet/0000-0003-2119-8266; Gullu, Hasan Huseyin/0000-0001-8541-5309en_US
dc.description.abstractIn the present work, CuZnSe2 (CZSe) thin films were co-deposited by magnetron sputtering of ZnSe and Cu targets. The structural analyses resulted in the stoichiometric elemental composition and polycrystalline nature without secondary phase contribution in the film structure. Optical and electrical properties of CZSe thin films were investigated using temperature-dependent optical transmission and electrical conductivity measurements. The band gap energy values were obtained using transmittance spectra under the light of expression relating absorption coefficient to incident photon energy. Band gap energy values were found in decreasing behavior from 2.31 to 2.27 eV with increase in temperature from 10 to 300 K. Temperature-band gap dependency was evaluated by Varshni and O'Donnell models to detail the optical parameters of the thin films. The experimental dark and photoconductivity values were investigated by thermionic emission model over the grain boundary potential. Room temperature conductivity values were obtained in between 0.91 and 4.65 ( x 10(-4) Omega(-1)cm(-1)) under various illumination intensities. Three different linear conductivity regions were observed in the temperature dependent profile. These linear regions were analyzed to extract the activation energy values.en_US
dc.description.sponsorshipMiddle East Technical University [METU-GAP-105-2018-2755]en_US
dc.description.sponsorshipThis work was financed by Middle East Technical University under Grant No. METU-GAP-105-2018-2755.en_US
dc.identifier.citation4
dc.identifier.doi10.1016/j.tsf.2020.137941
dc.identifier.issn0040-6090
dc.identifier.scopus2-s2.0-85081653739
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2020.137941
dc.identifier.urihttps://hdl.handle.net/20.500.14411/3138
dc.identifier.volume701en_US
dc.identifier.wosWOS:000525745900021
dc.identifier.wosqualityQ3
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.ispartof46th International Conference on Metallurgical Coatings and Thin Films (ICMCTF) -- MAY 19-24, 2019 -- San Diego, CAen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectThin filmen_US
dc.subjectTemperature effecten_US
dc.subjectOptical propertiesen_US
dc.subjectPhotoconductivityen_US
dc.titleTemperature-dependent material characterization of CuZnSe<sub>2</sub> thin filmsen_US
dc.typeConference Objecten_US
dspace.entity.typePublication
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