Optical Characterization of Cuin<sub>5</Sub>s<sub>8< Crystals by Ellipsometry Measurements
| dc.authorid | Gasanly, Nizami/0000-0002-3199-6686 | |
| dc.authorid | Gasanly, Nizami/0000-0002-3199-6686 | |
| dc.authorscopusid | 23766993100 | |
| dc.authorscopusid | 35580905900 | |
| dc.authorwosid | Gasanly, Nizami/HRE-1447-2023 | |
| dc.authorwosid | Isik, Mehmet/KMY-5305-2024 | |
| dc.authorwosid | Gasanly, Nizami/ABA-2249-2020 | |
| dc.contributor.author | Isik, Mehmet | |
| dc.contributor.author | Gasanly, Nizami | |
| dc.contributor.other | Department of Electrical & Electronics Engineering | |
| dc.date.accessioned | 2024-07-05T14:29:12Z | |
| dc.date.available | 2024-07-05T14:29:12Z | |
| dc.date.issued | 2016 | |
| dc.department | Atılım University | en_US |
| dc.department-temp | [Isik, Mehmet] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Gasanly, Nizami] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkey; [Gasanly, Nizami] Baku State Univ, Virtual Int Sci Res Ctr, Baku 1148, Azerbaijan | en_US |
| dc.description | Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686 | en_US |
| dc.description.abstract | Optical properties of CuIn5S8 crystals grown by Bridgman method were investigated by ellipsometry measurements. Spectral dependence of optical parameters; real and imaginary parts of the pseudodielectric function, pseudorefractive index, pseudoextinction coefficient, reflectivity and absorption coefficients were obtained from the analysis of ellipsometry experiments performed in the 1.2-6.2 eV spectral region. Analysis of spectral dependence of the absorption coefficient revealed the existence of direct band gap transitions with energy 1.53 eV. Wemple-DiDomenico and Spitzer-Fan models were used to find the oscillator energy, dispersion energy, zero-frequency refractive index and high-frequency dielectric constant values. Structural properties of the CuIn5S8 crystals were investigated using X-ray diffraction and energy dispersive spectroscopy analysis. (C) 2015 Elsevier Ltd. All rights reserved. | en_US |
| dc.identifier.citationcount | 6 | |
| dc.identifier.doi | 10.1016/j.jpcs.2015.11.020 | |
| dc.identifier.endpage | 17 | en_US |
| dc.identifier.issn | 0022-3697 | |
| dc.identifier.issn | 1879-2553 | |
| dc.identifier.scopus | 2-s2.0-84954495506 | |
| dc.identifier.startpage | 13 | en_US |
| dc.identifier.uri | https://doi.org/10.1016/j.jpcs.2015.11.020 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14411/480 | |
| dc.identifier.volume | 91 | en_US |
| dc.identifier.wos | WOS:000373245800003 | |
| dc.identifier.wosquality | Q2 | |
| dc.institutionauthor | Işık, Mehmet | |
| dc.language.iso | en | en_US |
| dc.publisher | Pergamon-elsevier Science Ltd | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.scopus.citedbyCount | 5 | |
| dc.subject | Semiconductors | en_US |
| dc.subject | Optical materials | en_US |
| dc.subject | Optical properties | en_US |
| dc.title | Optical Characterization of Cuin<sub>5</Sub>s<sub>8< Crystals by Ellipsometry Measurements | en_US |
| dc.type | Article | en_US |
| dc.wos.citedbyCount | 5 | |
| dspace.entity.type | Publication | |
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