Electrical Conductivity and Hall Mobility in P-Type Tlgase<sub>2</Sub> Crystals

dc.authorid Qasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorscopusid 6603962677
dc.authorscopusid 35580905900
dc.authorwosid Chen, Tianren/AAS-6018-2021
dc.authorwosid Qasrawi, Atef Fayez/R-4409-2019
dc.authorwosid Gasanly, Nizami/HRE-1447-2023
dc.authorwosid Gasanly, Nizami/ABA-2249-2020
dc.contributor.author Qasrawi, AF
dc.contributor.author Qasrawı, Atef Fayez Hasan
dc.contributor.author Gasanly, NM
dc.contributor.author Qasrawı, Atef Fayez Hasan
dc.contributor.other Department of Electrical & Electronics Engineering
dc.contributor.other Department of Electrical & Electronics Engineering
dc.date.accessioned 2024-07-05T15:08:41Z
dc.date.available 2024-07-05T15:08:41Z
dc.date.issued 2004
dc.department Atılım University en_US
dc.department-temp Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkey en_US
dc.description Qasrawi, Atef Fayez/0000-0001-8193-6975; Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686 en_US
dc.description.abstract Systematic dark electrical conductivity and Hall mobility measurements have been carried out in the temperature range of 200-350 K on p-type TlGaSe2 crystals. The analysis of the temperature-dependent electrical conductivity and carrier concentration reveals the extrinsic type of conduction with an acceptor impurity level located at 0.33 eV, and donor and acceptor concentrations of 9.0 x 10(15) and 1.3 x 10(16) cm(-3), respectively. A hole and electron effective masses of 0.520m(0) and 0.325m(0), respectively, with a donor to acceptor compensating ratio of 0.69 are also being identified. The Hall mobility is found to be limited by the hole-phonon short-range interactions scattering with a hole-phonon coupling constant of 0.17. (C) 2004 Elsevier Ltd. All rights reserved. en_US
dc.identifier.citationcount 28
dc.identifier.doi 10.1016/j.materresbull.2003.12.018
dc.identifier.endpage 1359 en_US
dc.identifier.issn 0025-5408
dc.identifier.issue 9 en_US
dc.identifier.scopus 2-s2.0-2942620901
dc.identifier.startpage 1353 en_US
dc.identifier.uri https://doi.org/10.1016/j.materresbull.2003.12.018
dc.identifier.uri https://hdl.handle.net/20.500.14411/1086
dc.identifier.volume 39 en_US
dc.identifier.wos WOS:000222362100020
dc.identifier.wosquality Q2
dc.institutionauthor Qasrawı, Atef Fayez Hasan
dc.language.iso en en_US
dc.publisher Pergamon-elsevier Science Ltd en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 10
dc.subject semiconductors en_US
dc.subject Chalcogenides en_US
dc.subject layered compounds en_US
dc.subject defects en_US
dc.subject electrical properties en_US
dc.title Electrical Conductivity and Hall Mobility in P-Type Tlgase<sub>2</Sub> Crystals en_US
dc.type Article en_US
dc.wos.citedbyCount 28
dspace.entity.type Publication
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