Parallel and Consecutive-<i>k</I>-out-of-<i>n< Systems Under Stochastic Deterioration

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Date

2014

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Publisher

Elsevier Science inc

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Green Open Access

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Abstract

In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD. (C) 2013 Elsevier Inc. All rights reserved.

Description

Eryilmaz, Serkan/0000-0002-2108-1781

Keywords

Consecutive-k-out-of-n:F system, Deterioration, Maximal signature, Parallel system, Reliability, Reliability and life testing, reliability, parallel system, maximal signature, deterioration, consecutive-\(k\)-out-of-\( n\):F system

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Fields of Science

0209 industrial biotechnology, 02 engineering and technology, 0101 mathematics, 01 natural sciences

Citation

WoS Q

Q1

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2

Source

Applied Mathematics and Computation

Volume

227

Issue

Start Page

19

End Page

26

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Scopus : 6

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6

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5

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1

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