Parallel and Consecutive-<i>k</I>-out-of-<i>n< Systems Under Stochastic Deterioration

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2014

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Elsevier Science inc

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Industrial Engineering
(1998)
Industrial Engineering is a field of engineering that develops and applies methods and techniques to design, implement, develop and improve systems comprising of humans, materials, machines, energy and funding. Our department was founded in 1998, and since then, has graduated hundreds of individuals who may compete nationally and internationally into professional life. Accredited by MÜDEK in 2014, our student-centered education continues. In addition to acquiring the knowledge necessary for every Industrial engineer, our students are able to gain professional experience in their desired fields of expertise with a wide array of elective courses, such as E-commerce and ERP, Reliability, Tabulation, or Industrial Engineering Applications in the Energy Sector. With dissertation projects fictionalized on solving real problems at real companies, our students gain experience in the sector, and a wide network of contacts. Our education is supported with ERASMUS programs. With the scientific studies of our competent academic staff published in internationally-renowned magazines, our department ranks with the bests among other universities. IESC, one of the most active student networks at our university, continues to organize extensive, and productive events every year.

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In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD. (C) 2013 Elsevier Inc. All rights reserved.

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Eryilmaz, Serkan/0000-0002-2108-1781
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Consecutive-k-out-of-n:F system, Deterioration, Maximal signature, Parallel system, Reliability

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227

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19

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26

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https://doi.org/10.1016/j.amc.2013.10.081
 https://hdl.handle.net/20.500.14411/77

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