Parallel and Consecutive-<i>k</I>-out-of-<i>n< Systems Under Stochastic Deterioration
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Date
2014
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier Science inc
Open Access Color
Green Open Access
No
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Publicly Funded
No
Abstract
In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD. (C) 2013 Elsevier Inc. All rights reserved.
Description
Eryilmaz, Serkan/0000-0002-2108-1781
ORCID
Keywords
Consecutive-k-out-of-n:F system, Deterioration, Maximal signature, Parallel system, Reliability, Reliability and life testing, reliability, parallel system, maximal signature, deterioration, consecutive-\(k\)-out-of-\( n\):F system
Turkish CoHE Thesis Center URL
Fields of Science
0209 industrial biotechnology, 02 engineering and technology, 0101 mathematics, 01 natural sciences
Citation
WoS Q
Q1
Scopus Q
Q1

OpenCitations Citation Count
2
Source
Applied Mathematics and Computation
Volume
227
Issue
Start Page
19
End Page
26
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6
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5
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1
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