Semiconductor Laser Modeling With Anfis

dc.authorscopusid 7003959561
dc.authorscopusid 35770239600
dc.authorscopusid 7003601363
dc.authorscopusid 35770709300
dc.contributor.author Çelebi,F.V.
dc.contributor.author Altindaǧ,T.
dc.contributor.author Yildirim,R.
dc.contributor.author Gökrem,L.
dc.contributor.other Computer Engineering
dc.date.accessioned 2024-07-05T15:43:20Z
dc.date.available 2024-07-05T15:43:20Z
dc.date.issued 2009
dc.department Atılım University en_US
dc.department-temp Çelebi F.V., AnkaraUniversity, Computer Engineering Department, 06500 Ankara, Turkey; Altindaǧ T., Atilim University, Department of Computer Engineering, 06836 Ankara, Turkey; Yildirim R., Gazi University, Faculty of Industrial Arts, 06500 Ankara, Turkey; Gökrem L., Gaziosmanpaşa University, Vocational School of Technology, 60100 Tokat, Turkey en_US
dc.description.abstract In this study, neuro-fuzzy (NF) models are used which are well-known robust learning systems that combine the advantages of fuzzy sets and neuro-computation theory. Particularly, a single model based on the adaptive network-based fuzzy inference system (ANFIS) is successfully developed from the amplified spontaneous emission (ASE) spectra of a semiconductor laser diode in order to obtain the critical quantities and their dependences on wavelength and currents. These critical quantities are the differential gain, the induced effective index change and the linewidth enhancement factor (α parameter). The comparison of single model results and the experimental measurements validate the presented approach. ©2009 IEEE. en_US
dc.identifier.citationcount 7
dc.identifier.doi 10.1109/ICAICT.2009.5372626
dc.identifier.isbn 978-142444740-4
dc.identifier.scopus 2-s2.0-77749340582
dc.identifier.uri https://doi.org/10.1109/ICAICT.2009.5372626
dc.identifier.uri https://hdl.handle.net/20.500.14411/3611
dc.institutionauthor Altındağ, Tuğba
dc.language.iso en en_US
dc.relation.ispartof 2009 International Conference on Application of Information and Communication Technologies, AICT 2009 -- 2009 International Conference on Application of Information and Communication Technologies, AICT 2009 -- 14 October 2009 through 16 October 2009 -- Baku -- 79447 en_US
dc.relation.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 7
dc.subject [No Keyword Available] en_US
dc.title Semiconductor Laser Modeling With Anfis en_US
dc.type Conference Object en_US
dspace.entity.type Publication
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relation.isAuthorOfPublication.latestForDiscovery 42959532-c82a-49c9-a166-6cc83eceec21
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relation.isOrgUnitOfPublication.latestForDiscovery e0809e2c-77a7-4f04-9cb0-4bccec9395fa

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