Qasrawı, Atef Fayez Hasan
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Qasrawi, Atef Fayez
Atef Fayez Hasan, Qasrawı
Qasrawı,A.F.H.
Qasrawi,A.F.H.
Q., Atef Fayez Hasan
Q.,Atef Fayez Hasan
Atef Fayez Hasan, Qasrawi
Qasrawi, Atef Fayez Hasan
A.F.H.Qasrawı
A.F.H.Qasrawi
A., Qasrawi
A.,Qasrawı
Qasrawı, Atef Fayez Hasan
Qasrawi, A. F.
Qasrawi,A.F.
Qasrawi, AF
Qasrawi, Atef F.
Qasrawi, Atef A.
Qasrawi, Atef Fayez
Qasrawi, Atef F.
Qasrawi, Atef A.
Qasrawi, Atef
Atef Fayez Hasan, Qasrawı
Qasrawı,A.F.H.
Qasrawi,A.F.H.
Q., Atef Fayez Hasan
Q.,Atef Fayez Hasan
Atef Fayez Hasan, Qasrawi
Qasrawi, Atef Fayez Hasan
A.F.H.Qasrawı
A.F.H.Qasrawi
A., Qasrawi
A.,Qasrawı
Qasrawı, Atef Fayez Hasan
Qasrawi, A. F.
Qasrawi,A.F.
Qasrawi, AF
Qasrawi, Atef F.
Qasrawi, Atef A.
Qasrawi, Atef Fayez
Qasrawi, Atef F.
Qasrawi, Atef A.
Qasrawi, Atef
Job Title
Doçent Doktor
Email Address
atef.qasrawi@atilim.edu.tr
Main Affiliation
Department of Electrical & Electronics Engineering
Status
Former Staff
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Scholarly Output
226
Articles
222
Views / Downloads
677/0
Supervised MSc Theses
0
Supervised PhD Theses
0
WoS Citation Count
1894
Scopus Citation Count
1915
Patents
0
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0
WoS Citations per Publication
8.38
Scopus Citations per Publication
8.47
Open Access Source
17
Supervised Theses
0
| Journal | Count |
|---|---|
| Crystal Research and Technology | 16 |
| Journal of Electronic Materials | 15 |
| physica status solidi (a) | 12 |
| Materials Science in Semiconductor Processing | 11 |
| Journal of Alloys and Compounds | 11 |
Current Page: 1 / 11
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27 results
Scholarly Output Search Results
Now showing 1 - 10 of 27
Article Citation - WoS: 2Citation - Scopus: 2Electron-Lattice Interaction Scattering Mobility in Tl2ingase4< Single Crystals(Iop Publishing Ltd, 2008) Qasrawi, A. F.; Gasanly, N. M.In this work, the dark electrical resistivity, charge carrier density and Hall mobility of Tl(2)InGaSe(4) single crystal have been recorded and analyzed to investigate the dominant scattering mechanism in the crystal. The data analyses have shown that this crystal exhibits an extrinsic n-type conduction. The temperature-dependent dark electrical resistivity analysis reflected the existence of two energy levels as 0.396 and 0.512 eV, being dominant above and below 260 K, respectively. The temperature dependence of the carrier density was analyzed by using the single-donor-single-acceptor model. The latter analysis has shown that the above maintained 0.512 eV energy level is a donor impurity level. The compensation ratio for this crystal is determined as 0.96. The Hall mobility of Tl(2)InGaSe(4) is found to be limited by the scattering of electron-acoustic phonon interactions. The calculated theoretical acoustic phonon scattering mobility agrees with the experimental one under the condition that the acoustic deformation potential is 12.5 eV.Article Citation - Scopus: 1Polarization Sensitive Reflection and Dielectric Spectra in Gase Thin Films(Hindawi Ltd, 2016) Khanfar, Hazem K.; Qasrawi, Atef A.The light polarization effects on the optical reflective and dielectric spectra of GaSe thin films are studied in the incident light wavelength range of 200-1100 nm. In this range of measurement, the angle of incidence (theta(i)) of light was varied between 30 degrees and 80 degrees. In addition, at theta(i) of 30 degrees the light polarizing angle (delta) was altered in the range of 0-90 degrees. Regardless of the value of lambda, for all theta(i) > 65 degrees, the total reflectance sharply decreased with increasing theta(i). In addition, when theta(i) is fixed at 30 and delta was varied, the amplitudes ratio of the polarized waves exhibits a resonance-antiresonance phenomenon at a wavelength that coincides with the film's thickness (800 nm). This behavior was assigned to the coupled interference between incident and reflected waves and to the strong absorption effects. Two main resonance peaks are observed as response to s-polarized and normal incident beam: one is at similar to 540 (556 nm) and the other at similar to 420 THz (714 nm). The dielectric constant of the GaSe films exhibits anisotropic characteristics that nominate it for use as multipurpose optoelectronic devices.Article Citation - WoS: 1Citation - Scopus: 1Hole-Polar Phonon Interaction Scattering Mobility in Chain Structured Tlse0.75s0.25< Crystals(Wiley-blackwell, 2009) Qasrawi, A. F.; Gasanly, N. M.In this study, the electrical resistivity, charge carriers density and Hall mobility of chain structured TlSe0.75S0.25 crystal have been measured and analyzed to establish the dominant scattering mechanism in crystal. The data analyses have shown that this crystal exhibits an extrinsic p-type conduction. The temperature-dependent dark electrical resistivity analysis reflected the existence of three energy levels located at 280 meV, 68 meV and 48 meV. The temperature dependence of carrier density was analyzed by using the single donor-single acceptor model. The carrier concentration data were best reproduced assuming the existence of an acceptor impurity level being located at 68 meV consistent with that observed from resistivity measurement, The model allowed the determination of the hole effective mass and the acceptor-donor concentration difference as 0.44m(0) and 2.2 x 10(12) cm(-3), respectively. The Hall mobility of the TlSe0.75S0.25 crystal is found to be limited by the scattering of charged carriers over the (chain) boundaries and the scattering of hole-polar phonon interactions above and below 300 K, respectively. The value of the energy barrier height at the chain boundaries was found to be 261 meV. The polar phonon scattering mobility revealed the high-frequency and static dielectric constants of 13.6 and 15.0, respectively. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, WeinheimArticle Citation - WoS: 5Citation - Scopus: 5Dispersive Optical Constants of Tl2ingase4< Single Crystals(Iop Publishing Ltd, 2007) Qasrawi, A. F.; Gasanly, N. M.The structural and optical properties of Bridgman method grown Tl2InGaSe4 crystals have been investigated by means of room temperature x-ray diffraction, and transmittance and reflectance spectral analysis, respectively. The x-ray diffraction technique has shown that Tl2InGaSe4 is a single phase crystal of a monoclinic unit cell that exhibits the lattice parameters of a = 0.77244 nm, b = 0.64945 nm, c = 0.92205 nm and beta = 95.03 degrees . The optical data have revealed an indirect allowed transition band gap of 1.86 eV. The room temperature refractive index, which was calculated from the reflectance and transmittance data, allowed the identification of the dispersion and oscillator energies, static dielectric constant and static refractive index as 28.51 and 3.45 eV, 9.26 and 3.04, respectively.Article Citation - WoS: 18Citation - Scopus: 18Growth, Electrical and Structural Characterization of Β-Gase Thin Films(Springer, 2003) Parlak, M; Qasrawi, AF; Erçelebi, ÇGaSe thin films were deposited onto the glass substrates kept at 200degrees and 300degreesC by the thermal evaporation of GaSe crystals under the pressure of 10(-5) Torr. X-ray analysis of the films revealed that films grown at 200. C are amorphous in nature while the films grown at 300degreesC are polycrystalline beta-GaSe. The temperature dependent electrical conductivity measurements in the region of 320-100 K for the films grown at 300degreesC showed that the transport mechanisms are the thermionic emission of charged carriers and the variable range hopping above and below 180 K, respectively. Space charge limited current (SCLC) studies have also been performed on these films through the current-voltage measurements at different temperatures and a dominant hole trap at 0.233 eV from the top of the valance band with a trap density of similar to1.6 x 10(11) cm(-3) is identified. (C) 2003 Kluwer Academic Publishers.Article Citation - WoS: 3Citation - Scopus: 3Optoelectronic Properties of Ga4se3< Single Crystals(Iop Publishing Ltd, 2008) Qasrawi, A. F.; Gasanly, N. M.; Ilaiwi, K. F.The optoelectronic properties of Bridgman method-grown Ga(4)Se(3)S single crystals have been investigated by means of room temperature electrical resistivity, temperature-dependent photosensitivity and temperature-dependent optical absorption. The photosensitivity was observed to increase with decreasing temperature, the illumination dependence of which was found to exhibit monomolecular recombination in the bulk at 300 K. The absorption coefficient, which was calculated in the incident photon energy range of 2.01-2.35 eV, increased with increasing temperature. Consistently, the absorption edge shifts to lower energy values. The fundamental absorption edge corresponds to an indirect allowed transitions energy gap (2.08 eV at 300 K) that exhibits a temperature coefficient of -95 x 10(-4) eVK(-1).Article Citation - WoS: 4Citation - Scopus: 4Hall Mobility and Photoconductivity in Tlgases Crystals(Amer inst Physics, 2013) Qasrawi, A. F.; Gasanly, N. M.In this work, the fundamental properties of the TlGaSeS single crystals are investigated by means of temperature dependent electrical resistivity and Hall mobility. The crystal photo-responsibility as function of illumination intensity and temperature is also tested in the temperature range of 350-160 K. The study allowed the determination of acceptor centers as 230 and 450 meV below and above 260 K, and recombination centers as 181, 363, and 10 meV at low, moderate, and high temperatures, respectively. While the temperature-dependent Hall mobility behaved abnormally, the photoconductivity analysis reflected an illumination intensity dependent recombination center. Namely, the recombination center increased from 10 to 90 meV as the light intensity increased from 27.9 to 76.7 mW cm(-2), respectively. That strange behavior was attributed to the temporary shift in Fermi level caused by photoexcitation. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4775577]Article Citation - WoS: 30Citation - Scopus: 30Optoelectronic and Electrical Properties of Tlgas2 Single Crystal(Wiley-v C H verlag Gmbh, 2005) Qasrawi, AF; Gasanly, NMThe optoelectronic and electrical properties of TIGaS2 single crystals have been investigated by means of room temperature transmittance and reflectance spectral analysis, Hall coefficient, dark electrical resistivity and photocurrent measurements in the temperature range of 200-350 K. The optical data have revealed an indirect and direct allowed transition band gaps of 2.45 and 2.51 eV, an oscillator and dispersion energy of 5.04 and 26.45 eV, respectively, a static dielectric constant of 6.25 and static refractive index of 2.50. The dark Hall coefficient measurements have shown that the crystals exhibit a conductivity type conversion from p-type to n-type at a critical temperature of 315 K. Deep donor and acceptor energy levels of 0.37/0.36 eV and 0.66 eV has been calculated from the temperature dependence of Hall coefficient and resistivity, and photocurrent measurements, respectively. The photocurrent decreases with decreasing temperature. The analysis of the photocurrent data have revealed that, the recombination mechanism is linear and supralinear above and below 290 K, respectively. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.Article Citation - WoS: 16Citation - Scopus: 17Investigation of Localized Levels in Gas0.5se0.5< Layered Crystals by Means of Electrical, Space-Charge Limited Current and Photoconductivity Measurements(Wiley-v C H verlag Gmbh, 2002) Qasrawi, AF; Gasanly, NMTo identify the localized levels in GaS0.5Se0.5 single crystals, the dark electrical conductivity, current-voltage characteristics and photoconductivity measurements were carried out in the temperature range of 250-400 K. Temperature dependence of dark electrical conductivity and the space-charge limited current studies indicate the presence of a single discrete trapping level located at 0.31 eV below the conduction band with a density of about 1.3 x 10(15) cm(-3). The conductivity data above 320 K reveal an additional donor level with activation energy of 0.40 eV indicating the extrinsic nature of conduction. The spectral distribution of photocurrent in the photon energy range of 0.65-5.9 eV reveals an indirect band gap of 2.26 eV. The photocurrent-illumination intensity dependence follows the law I-ph proportional to F-gamma, with gamma being 1.0, 0.65, and 0.5 at low, moderate and high illumination intensities, respectively. The corresponding behavior indicates the domination of monomolecular recombination, near equal densities of trapped and recombination centers and bimolecular recombination. It is observed that the photocurrent increases in the temperature range from 250 K up to T-m = 360 K and decreases for T > T-m. The temperature dependence of the photocurrent reveals two additional impurity levels with activation energies of 0.14 and 0.10 eV below and above Tm, respectively.Article Citation - WoS: 14Citation - Scopus: 13Light Illumination Effect on the Electrical and Photovoltaic Properties of In6s7< Crystals(Iop Publishing Ltd, 2006) Qasrawi, AF; Gasanly, NMThe electrical and photoelectrical properties of In6S7 crystals have been investigated in the temperature regions of 170-300 K and 150-300 K, respectively. The dark electrical analysis revealed the intrinsic type of conduction. The energy band gap obtained from the temperature-dependent dark current is found to be 0.75 eV. It is observed that the photocurrent increases in the temperature range of 150 K up to T-m = 230 K and decreases at T > T-m. Two photoconductivity activation energies of 0.21 and 0.10 eV were determined for the temperature ranges below and above Tm, respectively. The photocurrent (I-ph)-illumination intensity (F) dependence follows the law I-ph alpha F-gamma. The value of. decreases when the temperature is raised to T-m, then it starts increasing. The change in the value. with temperature is attributed to the exchange in role between the recombination and trapping centres in the crystal. The crystals are found to exhibit photovoltaic properties. The photovoltage is recorded as a function of illumination intensity at room temperature. The maximum open-circuit voltage and short-circuit photocurrent density, which are related to an illumination intensity equivalent to one sun, are 0.12 V and 0.38 mA cm(-2), respectively.
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