Thermoluminescence Characteristics of Tl<sub>4</Sub>gain<sub>3< Layered Single Crystals

dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridDelice, Serdar/0000-0001-5409-6528
dc.authorscopusid55751932500
dc.authorscopusid23766993100
dc.authorscopusid35580905900
dc.authorwosidIsik, Mehmet/KMY-5305-2024
dc.authorwosidDelice, Serdar/AAF-2712-2019
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.authorwosidDelice, Serdar/AAU-4793-2020
dc.contributor.authorDelice, S.
dc.contributor.authorIşık, Mehmet
dc.contributor.authorIsik, M.
dc.contributor.authorGasanly, N. M.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T14:26:00Z
dc.date.available2024-07-05T14:26:00Z
dc.date.issued2014
dc.departmentAtılım Universityen_US
dc.department-temp[Delice, S.; Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkey; [Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkeyen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Delice, Serdar/0000-0001-5409-6528en_US
dc.description.abstractThe properties of trapping centres in - as grown - Tl4GaIn3S8 layered single crystals were investigated in the temperature range of 10-300K using thermoluminescence (TL) measurements. TL curve was analysed to characterize the defects responsible for the observed peaks. Thermal activation energies of the trapping centres were determined using various methods: curve fitting, initial rise and peak shape methods. The results indicated that the peak observed in the low-temperature region composed of many overlapped peaks corresponding to distributed trapping centres in the crystal structure. The apparent thermal energies of the distributed traps were observed to be shifted from similar to 12 to similar to 125meV by increasing the illumination temperature from 10 to 36K. The analysis revealed that the first-order kinetics (slow retrapping) obeys for deeper level located at 292meV.en_US
dc.identifier.citation2
dc.identifier.doi10.1080/14786435.2013.848303
dc.identifier.endpage151en_US
dc.identifier.issn1478-6435
dc.identifier.issn1478-6443
dc.identifier.issue2en_US
dc.identifier.scopus2-s2.0-84891835990
dc.identifier.scopusqualityQ3
dc.identifier.startpage141en_US
dc.identifier.urihttps://doi.org/10.1080/14786435.2013.848303
dc.identifier.urihttps://hdl.handle.net/20.500.14411/82
dc.identifier.volume94en_US
dc.identifier.wosWOS:000329154900003
dc.identifier.wosqualityQ3
dc.language.isoenen_US
dc.publisherTaylor & Francis Ltden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectdefectsen_US
dc.subjectsemiconductorsen_US
dc.subjectcrystalsen_US
dc.titleThermoluminescence Characteristics of Tl<sub>4</Sub>gain<sub>3< Layered Single Crystalsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery0493a5b0-644f-4893-9f39-87538d8d6709
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relation.isOrgUnitOfPublication.latestForDiscoveryc3c9b34a-b165-4cd6-8959-dc25e91e206b

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