Determination of Trapping Parameters of Thermoluminescent Glow Peaks of Semiconducting Tl<sub>2</Sub>ga<sub>2< Crystals

dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorscopusid 23766993100
dc.authorscopusid 7005994646
dc.authorscopusid 35580905900
dc.authorwosid Gasanly, Nizami/HRE-1447-2023
dc.authorwosid Gasanly, Nizami/ABA-2249-2020
dc.authorwosid Isik, Mehmet/KMY-5305-2024
dc.authorwosid YILDIRIM, Tacettin/KMX-4607-2024
dc.contributor.author Isik, M.
dc.contributor.author Yildirim, T.
dc.contributor.author Gasanly, N. M.
dc.contributor.other Department of Electrical & Electronics Engineering
dc.date.accessioned 2024-07-05T14:32:30Z
dc.date.available 2024-07-05T14:32:30Z
dc.date.issued 2015
dc.department Atılım University en_US
dc.department-temp [Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Yildirim, T.] Nevsehir Haci Bektas Veli Univ, Dept Phys, TR-50300 Nevsehir, Turkey; [Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkey; [Gasanly, N. M.] Baku State Univ, Virtual Int Sci Res Ctr, Baku 1148, Azerbaijan en_US
dc.description Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; en_US
dc.description.abstract Thermoluminescence (TL) properties of Tl2Ga2S3Se layered single crystals were researched in the temperature range of 290-770 K. U glow curve exhibited two peaks with maximum temperatures of similar to 373 and 478 K. Curve fitting, initial rise and peak shape methods were used to determine the activation energies of the trapping centers associated with these peaks. Applied methods were in good agreement with the energies of 780 and 950 meV. Capture cross sections and attempt-to-escape frequencies of the trapping centers were reported. An energy level diagram showing transitions in the band gap of the crystal was plotted under the light of the results of the present work and previously reported papers on photoluminescence, thermoluminescence and thermally stimulated current measurements carried out below room temperature. (C) 2015 Elsevier Ltd. All rights reserved. en_US
dc.identifier.citationcount 5
dc.identifier.doi 10.1016/j.jpcs.2015.03.007
dc.identifier.endpage 59 en_US
dc.identifier.issn 0022-3697
dc.identifier.issn 1879-2553
dc.identifier.scopus 2-s2.0-84925061587
dc.identifier.startpage 56 en_US
dc.identifier.uri https://doi.org/10.1016/j.jpcs.2015.03.007
dc.identifier.uri https://hdl.handle.net/20.500.14411/820
dc.identifier.volume 82 en_US
dc.identifier.wos WOS:000353741600009
dc.identifier.wosquality Q2
dc.institutionauthor Işık, Mehmet
dc.language.iso en en_US
dc.publisher Pergamon-elsevier Science Ltd en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 5
dc.subject Semiconductors en_US
dc.subject Crystal growth en_US
dc.subject Luminescence en_US
dc.subject Defects en_US
dc.title Determination of Trapping Parameters of Thermoluminescent Glow Peaks of Semiconducting Tl<sub>2</Sub>ga<sub>2< Crystals en_US
dc.type Article en_US
dc.wos.citedbyCount 5
dspace.entity.type Publication
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