Determination of trapping parameters of thermoluminescent glow peaks of semiconducting Tl<sub>2</sub>Ga<sub>2</sub>S<sub>3</sub>Se crystals

dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authorscopusid23766993100
dc.authorscopusid7005994646
dc.authorscopusid35580905900
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.authorwosidIsik, Mehmet/KMY-5305-2024
dc.authorwosidYILDIRIM, Tacettin/KMX-4607-2024
dc.contributor.authorIşık, Mehmet
dc.contributor.authorYildirim, T.
dc.contributor.authorGasanly, N. M.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T14:32:30Z
dc.date.available2024-07-05T14:32:30Z
dc.date.issued2015
dc.departmentAtılım Universityen_US
dc.department-temp[Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Yildirim, T.] Nevsehir Haci Bektas Veli Univ, Dept Phys, TR-50300 Nevsehir, Turkey; [Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkey; [Gasanly, N. M.] Baku State Univ, Virtual Int Sci Res Ctr, Baku 1148, Azerbaijanen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686;en_US
dc.description.abstractThermoluminescence (TL) properties of Tl2Ga2S3Se layered single crystals were researched in the temperature range of 290-770 K. U glow curve exhibited two peaks with maximum temperatures of similar to 373 and 478 K. Curve fitting, initial rise and peak shape methods were used to determine the activation energies of the trapping centers associated with these peaks. Applied methods were in good agreement with the energies of 780 and 950 meV. Capture cross sections and attempt-to-escape frequencies of the trapping centers were reported. An energy level diagram showing transitions in the band gap of the crystal was plotted under the light of the results of the present work and previously reported papers on photoluminescence, thermoluminescence and thermally stimulated current measurements carried out below room temperature. (C) 2015 Elsevier Ltd. All rights reserved.en_US
dc.identifier.citation5
dc.identifier.doi10.1016/j.jpcs.2015.03.007
dc.identifier.endpage59en_US
dc.identifier.issn0022-3697
dc.identifier.issn1879-2553
dc.identifier.scopus2-s2.0-84925061587
dc.identifier.startpage56en_US
dc.identifier.urihttps://doi.org/10.1016/j.jpcs.2015.03.007
dc.identifier.urihttps://hdl.handle.net/20.500.14411/820
dc.identifier.volume82en_US
dc.identifier.wosWOS:000353741600009
dc.identifier.wosqualityQ2
dc.language.isoenen_US
dc.publisherPergamon-elsevier Science Ltden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSemiconductorsen_US
dc.subjectCrystal growthen_US
dc.subjectLuminescenceen_US
dc.subjectDefectsen_US
dc.titleDetermination of trapping parameters of thermoluminescent glow peaks of semiconducting Tl<sub>2</sub>Ga<sub>2</sub>S<sub>3</sub>Se crystalsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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