Electrical Parameters of Al/Inse Rf Sensors

dc.authoridQasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid6603962677
dc.authorwosidQasrawi, Atef Fayez/R-4409-2019
dc.contributor.authorQasrawi, A. F.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T14:26:47Z
dc.date.available2024-07-05T14:26:47Z
dc.date.issued2014
dc.departmentAtılım Universityen_US
dc.department-temp[Qasrawi, A. F.] Arab Amer Univ, Dept Phys, Jenin, West Bank, Israel; [Qasrawi, A. F.] Atilim Univ, Fac Engn, Grp Phys, TR-06836 Ankara, Turkeyen_US
dc.descriptionQasrawi, Atef Fayez/0000-0001-8193-6975en_US
dc.description.abstractAn Al/InSe/C Schottky device is designed on the surface of amorphous InSe thin films. The device is observed to exhibit a switching property at particular biasing voltages. The 'on/off' current ratio is found to be 7.9 and 9.3 at forward and reverse biasing voltages of 2.0 and 2.25 V, respectively. The 'off' and 'on' operational modes are ascribed to the domination of the tunneling of charged particles through a barrier height of 0.83 eV with a depletion region width of 64 nm and due to the domination of the thermionic emission of charged carriers over a barrier height of 0.53 eV, respectively. In addition, the spectral analysis of the capacitance of the device which was carried in the frequency range of 10.0 k-3.0 GHz reflected dc voltage biasing-dependent high quality resonating peaks. The strongest one appeared at a frequency of 36.8 MHz for a biasing voltage of 0.70 V. Furthermore, the loss tangent of the Al/InSe/C device is found to be of the order of 10(-7) at 3.0 GHz. Consistently, the capacitance-voltage spectra of these sensors reflected pronounced tunability up to 100 MHz. The Al/InSe/C device performance, the switching properties and the quality of the resonance peaks indicate the possibility of using these sensors in RF technology.en_US
dc.description.sponsorshipscientific research council at the Ministry of Higher Education of the state of Palestine [2/1/2013]; scientific research council at the Arab American University [1 2013/2014]en_US
dc.description.sponsorshipThe scientific research council at the Ministry of Higher Education of the state of Palestine is acknowledged and thanked for their support to the physics laboratories at the Arab American University through the project coded 2/1/2013. The scientific research council at the Arab American University is also acknowledged and thanked for their support to the research labs during the fund cycle 1 2013/2014.en_US
dc.identifier.citationcount15
dc.identifier.doi10.1088/0031-8949/89/6/065802
dc.identifier.issn0031-8949
dc.identifier.issn1402-4896
dc.identifier.issue6en_US
dc.identifier.scopus2-s2.0-84899633802
dc.identifier.urihttps://doi.org/10.1088/0031-8949/89/6/065802
dc.identifier.urihttps://hdl.handle.net/20.500.14411/169
dc.identifier.volume89en_US
dc.identifier.wosWOS:000341518900025
dc.identifier.wosqualityQ2
dc.institutionauthorQasrawı, Atef Fayez Hasan
dc.language.isoenen_US
dc.publisherIop Publishing Ltden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount16
dc.subjectsemiconductor devicesen_US
dc.subjectInSeen_US
dc.subjectthin filmsen_US
dc.subjectRFen_US
dc.titleElectrical Parameters of Al/Inse Rf Sensorsen_US
dc.typeArticleen_US
dc.wos.citedbyCount15
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery1138e68c-e06a-4ee2-a5ec-1dd89a3ecc2c
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relation.isOrgUnitOfPublication.latestForDiscoveryc3c9b34a-b165-4cd6-8959-dc25e91e206b

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