Electrical Parameters of Al/Inse Rf Sensors
dc.authorid | Qasrawi, Atef Fayez/0000-0001-8193-6975 | |
dc.authorscopusid | 6603962677 | |
dc.authorwosid | Qasrawi, Atef Fayez/R-4409-2019 | |
dc.contributor.author | Qasrawi, A. F. | |
dc.contributor.other | Department of Electrical & Electronics Engineering | |
dc.date.accessioned | 2024-07-05T14:26:47Z | |
dc.date.available | 2024-07-05T14:26:47Z | |
dc.date.issued | 2014 | |
dc.department | Atılım University | en_US |
dc.department-temp | [Qasrawi, A. F.] Arab Amer Univ, Dept Phys, Jenin, West Bank, Israel; [Qasrawi, A. F.] Atilim Univ, Fac Engn, Grp Phys, TR-06836 Ankara, Turkey | en_US |
dc.description | Qasrawi, Atef Fayez/0000-0001-8193-6975 | en_US |
dc.description.abstract | An Al/InSe/C Schottky device is designed on the surface of amorphous InSe thin films. The device is observed to exhibit a switching property at particular biasing voltages. The 'on/off' current ratio is found to be 7.9 and 9.3 at forward and reverse biasing voltages of 2.0 and 2.25 V, respectively. The 'off' and 'on' operational modes are ascribed to the domination of the tunneling of charged particles through a barrier height of 0.83 eV with a depletion region width of 64 nm and due to the domination of the thermionic emission of charged carriers over a barrier height of 0.53 eV, respectively. In addition, the spectral analysis of the capacitance of the device which was carried in the frequency range of 10.0 k-3.0 GHz reflected dc voltage biasing-dependent high quality resonating peaks. The strongest one appeared at a frequency of 36.8 MHz for a biasing voltage of 0.70 V. Furthermore, the loss tangent of the Al/InSe/C device is found to be of the order of 10(-7) at 3.0 GHz. Consistently, the capacitance-voltage spectra of these sensors reflected pronounced tunability up to 100 MHz. The Al/InSe/C device performance, the switching properties and the quality of the resonance peaks indicate the possibility of using these sensors in RF technology. | en_US |
dc.description.sponsorship | scientific research council at the Ministry of Higher Education of the state of Palestine [2/1/2013]; scientific research council at the Arab American University [1 2013/2014] | en_US |
dc.description.sponsorship | The scientific research council at the Ministry of Higher Education of the state of Palestine is acknowledged and thanked for their support to the physics laboratories at the Arab American University through the project coded 2/1/2013. The scientific research council at the Arab American University is also acknowledged and thanked for their support to the research labs during the fund cycle 1 2013/2014. | en_US |
dc.identifier.citationcount | 15 | |
dc.identifier.doi | 10.1088/0031-8949/89/6/065802 | |
dc.identifier.issn | 0031-8949 | |
dc.identifier.issn | 1402-4896 | |
dc.identifier.issue | 6 | en_US |
dc.identifier.scopus | 2-s2.0-84899633802 | |
dc.identifier.uri | https://doi.org/10.1088/0031-8949/89/6/065802 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14411/169 | |
dc.identifier.volume | 89 | en_US |
dc.identifier.wos | WOS:000341518900025 | |
dc.identifier.wosquality | Q2 | |
dc.institutionauthor | Qasrawı, Atef Fayez Hasan | |
dc.language.iso | en | en_US |
dc.publisher | Iop Publishing Ltd | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.scopus.citedbyCount | 16 | |
dc.subject | semiconductor devices | en_US |
dc.subject | InSe | en_US |
dc.subject | thin films | en_US |
dc.subject | RF | en_US |
dc.title | Electrical Parameters of Al/Inse Rf Sensors | en_US |
dc.type | Article | en_US |
dc.wos.citedbyCount | 15 | |
dspace.entity.type | Publication | |
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