Electrical Parameters of Al/Inse Rf Sensors

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Date

2014

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Journal ISSN

Volume Title

Publisher

Iop Publishing Ltd

Open Access Color

Green Open Access

No

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Abstract

An Al/InSe/C Schottky device is designed on the surface of amorphous InSe thin films. The device is observed to exhibit a switching property at particular biasing voltages. The 'on/off' current ratio is found to be 7.9 and 9.3 at forward and reverse biasing voltages of 2.0 and 2.25 V, respectively. The 'off' and 'on' operational modes are ascribed to the domination of the tunneling of charged particles through a barrier height of 0.83 eV with a depletion region width of 64 nm and due to the domination of the thermionic emission of charged carriers over a barrier height of 0.53 eV, respectively. In addition, the spectral analysis of the capacitance of the device which was carried in the frequency range of 10.0 k-3.0 GHz reflected dc voltage biasing-dependent high quality resonating peaks. The strongest one appeared at a frequency of 36.8 MHz for a biasing voltage of 0.70 V. Furthermore, the loss tangent of the Al/InSe/C device is found to be of the order of 10(-7) at 3.0 GHz. Consistently, the capacitance-voltage spectra of these sensors reflected pronounced tunability up to 100 MHz. The Al/InSe/C device performance, the switching properties and the quality of the resonance peaks indicate the possibility of using these sensors in RF technology.

Description

Qasrawi, Atef Fayez/0000-0001-8193-6975

Keywords

semiconductor devices, InSe, thin films, RF

Turkish CoHE Thesis Center URL

Fields of Science

0103 physical sciences, 02 engineering and technology, 0210 nano-technology, 01 natural sciences

Citation

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OpenCitations Citation Count
16

Source

Physica Scripta

Volume

89

Issue

6

Start Page

065802

End Page

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CrossRef : 8

Scopus : 16

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Mendeley Readers : 9

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