New Statistical Randomness Tests Based on Length of Runs

dc.contributor.authorDoganaksoy, Ali
dc.contributor.authorSulak, Fatih
dc.contributor.authorUguz, Muhiddin
dc.contributor.authorSeker, Okan
dc.contributor.authorAkcengiz, Ziya
dc.contributor.otherMathematics
dc.date.accessioned2024-07-05T14:32:12Z
dc.date.available2024-07-05T14:32:12Z
dc.date.issued2015
dc.departmentAtılım Universityen_US
dc.department-temp[Doganaksoy, Ali; Uguz, Muhiddin; Seker, Okan; Akcengiz, Ziya] Middle E Tech Univ, Inst Appl Math, TR-06800 Ankara, Turkey; [Sulak, Fatih] Atilim Univ, Dept Math, TR-06836 Ankara, Turkeyen_US
dc.description.abstractRandom sequences and random numbers constitute a necessary part of cryptography. Many cryptographic protocols depend on random values. Randomness is measured by statistical tests and hence security evaluation of a cryptographic algorithm deeply depends on statistical randomness tests. In this work we focus on statistical distributions of runs of lengths one, two, and three. Using these distributions we state three new statistical randomness tests. New tests use chi(2) distribution and, therefore, exact values of probabilities are needed. Probabilities associated runs of lengths one, two, and three are stated. Corresponding probabilities are divided into five subintervals of equal probabilities. Accordingly, three new statistical tests are defined and pseudocodes for these new statistical tests are given. New statistical tests are designed to detect the deviations in the number of runs of various lengths from a random sequence. Together with some other statistical tests, we analyse our tests' results on outputs of well-known encryption algorithms and on binary expansions of e, pi, and root 2. Experimental results show the performance and sensitivity of our tests.en_US
dc.identifier.citation13
dc.identifier.doi10.1155/2015/626408
dc.identifier.issn1024-123X
dc.identifier.issn1563-5147
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1155/2015/626408
dc.identifier.urihttps://hdl.handle.net/20.500.14411/760
dc.identifier.volume2015en_US
dc.identifier.wosWOS:000355104700001
dc.institutionauthorSulak, Fatih
dc.language.isoenen_US
dc.publisherHindawi Ltden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subject[No Keyword Available]en_US
dc.titleNew Statistical Randomness Tests Based on Length of Runsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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relation.isOrgUnitOfPublication31ddeb89-24da-4427-917a-250e710b969c
relation.isOrgUnitOfPublication.latestForDiscovery31ddeb89-24da-4427-917a-250e710b969c

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