New Statistical Randomness Tests Based on Length of Runs

dc.contributor.author Doganaksoy, Ali
dc.contributor.author Sulak, Fatih
dc.contributor.author Uguz, Muhiddin
dc.contributor.author Seker, Okan
dc.contributor.author Akcengiz, Ziya
dc.contributor.other Mathematics
dc.contributor.other 02. School of Arts and Sciences
dc.contributor.other 01. Atılım University
dc.date.accessioned 2024-07-05T14:32:12Z
dc.date.available 2024-07-05T14:32:12Z
dc.date.issued 2015
dc.description.abstract Random sequences and random numbers constitute a necessary part of cryptography. Many cryptographic protocols depend on random values. Randomness is measured by statistical tests and hence security evaluation of a cryptographic algorithm deeply depends on statistical randomness tests. In this work we focus on statistical distributions of runs of lengths one, two, and three. Using these distributions we state three new statistical randomness tests. New tests use chi(2) distribution and, therefore, exact values of probabilities are needed. Probabilities associated runs of lengths one, two, and three are stated. Corresponding probabilities are divided into five subintervals of equal probabilities. Accordingly, three new statistical tests are defined and pseudocodes for these new statistical tests are given. New statistical tests are designed to detect the deviations in the number of runs of various lengths from a random sequence. Together with some other statistical tests, we analyse our tests' results on outputs of well-known encryption algorithms and on binary expansions of e, pi, and root 2. Experimental results show the performance and sensitivity of our tests. en_US
dc.identifier.doi 10.1155/2015/626408
dc.identifier.issn 1024-123X
dc.identifier.issn 1563-5147
dc.identifier.uri https://doi.org/10.1155/2015/626408
dc.identifier.uri https://hdl.handle.net/20.500.14411/760
dc.language.iso en en_US
dc.publisher Hindawi Ltd en_US
dc.relation.ispartof Mathematical Problems in Engineering
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject [No Keyword Available] en_US
dc.title New Statistical Randomness Tests Based on Length of Runs en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.institutional Sulak, Fatih
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gdc.coar.type text::journal::journal article
gdc.description.department Atılım University en_US
gdc.description.departmenttemp [Doganaksoy, Ali; Uguz, Muhiddin; Seker, Okan; Akcengiz, Ziya] Middle E Tech Univ, Inst Appl Math, TR-06800 Ankara, Turkey; [Sulak, Fatih] Atilim Univ, Dept Math, TR-06836 Ankara, Turkey en_US
gdc.description.endpage 14
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q2
gdc.description.startpage 1
gdc.description.volume 2015 en_US
gdc.identifier.openalex W2055534243
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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