Deep Learning-Based Defect Prediction for Mobile Applications

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Date

2022

Journal Title

Journal ISSN

Volume Title

Publisher

Mdpi

Open Access Color

GOLD

Green Open Access

Yes

OpenAIRE Downloads

OpenAIRE Views

Publicly Funded

No
Impulse
Top 10%
Influence
Average
Popularity
Top 10%

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Journal Issue

Abstract

Smartphones have enabled the widespread use of mobile applications. However, there are unrecognized defects of mobile applications that can affect businesses due to a negative user experience. To avoid this, the defects of applications should be detected and removed before release. This study aims to develop a defect prediction model for mobile applications. We performed cross-project and within-project experiments and also used deep learning algorithms, such as convolutional neural networks (CNN) and long short term memory (LSTM) to develop a defect prediction model for Android-based applications. Based on our within-project experimental results, the CNN-based model provides the best performance for mobile application defect prediction with a 0.933 average area under ROC curve (AUC) value. For cross-project mobile application defect prediction, there is still room for improvement when deep learning algorithms are preferred.

Description

Mishra, Alok/0000-0003-1275-2050; Catal, Cagatay/0000-0003-0959-2930

Keywords

software defect prediction, software fault prediction, mobile application, Android applications, deep learning, machine learning, software defect prediction; software fault prediction; mobile application; Android applications; deep learning; machine learning, Chemical technology, Mobile Application, Software Defect Prediction, deep learning, 006, Android Applications, TP1-1185, mobile application, Software Fault Prediction, Mobile Applications, Article, Machine Learning, Android applications; deep learning; machine learning; mobile application; software defect prediction; software fault prediction, software defect prediction, machine learning, Deep Learning, Android applications, Area Under Curve, software fault prediction, Neural Networks, Computer, Algorithms

Fields of Science

02 engineering and technology, 0202 electrical engineering, electronic engineering, information engineering

Citation

WoS Q

Q2

Scopus Q

Q1
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OpenCitations Citation Count
9

Source

Sensors

Volume

22

Issue

13

Start Page

4734

End Page

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Citations

CrossRef : 9

Scopus : 10

Captures

Mendeley Readers : 51

Web of Science™ Citations

6

checked on Mar 01, 2026

Page Views

2

checked on Mar 01, 2026

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1.5552

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