Browsing by Author "Yalcin,F."

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    Discrete Scan Statistics Generated by Dependent Trials and Their Applications in Reliability
    (Springer New York, 2024) Eryilmaz,S.; Yalcin,F.; Industrial Engineering
    The chapter is concerned with discrete scan statistic based on a sequence of dependent binary trials. In particular, the existing results are reviewed for the distribution of the discrete scan statistic based on a sequence of exchangeable binary trials. The results are discussed in the context of the reliability of the linear consecutive-k-within-m-out-of-n:F system, and a new exact formula for the reliability of the linear consecutive-2-within-m-out-of-n:F system that consists of arbitrarily dependent components is presented. © Springer Science+Business Media, LLC, part of Springer Nature 2024.