Browsing by Author "Eryilmaz,S."

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    Shocks, Scans, and Reliability Systems
    (Springer New York, 2024) Eryilmaz,S.; Industrial Engineering
    This chapter summarizes the close connection between one of the widely studied shock models known as δ-shock model and runs/scans. Under discrete time setting, i.e., when the shocks occur according to a binomial process, the linkage between the lifetime of the system under the shock model and the waiting time for the first scan is presented. Such a useful connection may create a new perspective to study the reliability properties of the system under the δ-shock model. © Springer Science+Business Media, LLC, part of Springer Nature 2024.