A Paired Learner-Based Approach for Concept Drift Detection and Adaptation in Software Defect Prediction

dc.authoridKumar, Dr Sandeep/0000-0003-0747-6776
dc.authoridKumar, Sandeep/0000-0002-3250-4866
dc.authoridMishra, Alok/0000-0003-1275-2050
dc.authoridKumar, Sandeep/0000-0001-9633-407X
dc.authorscopusid57226450033
dc.authorscopusid57218539729
dc.authorscopusid7201441575
dc.authorwosidKumar, Dr Sandeep/AAW-6313-2020
dc.authorwosidGangwar, Arvind Kumar Kumar/JHT-1207-2023
dc.authorwosidKumar, Sandeep/AAW-6570-2020
dc.authorwosidMishra, Alok/AAE-2673-2019
dc.contributor.authorGangwar, Arvind Kumar
dc.contributor.authorKumar, Sandeep
dc.contributor.authorMishra, Alok
dc.contributor.otherSoftware Engineering
dc.date.accessioned2024-07-05T15:19:37Z
dc.date.available2024-07-05T15:19:37Z
dc.date.issued2021
dc.departmentAtılım Universityen_US
dc.department-temp[Gangwar, Arvind Kumar; Kumar, Sandeep] Indian Inst Technol Roorkee, Dept Comp Sci & Engn, Roorkee 247667, Uttar Pradesh, India; [Mishra, Alok] Molde Univ Coll Specialized Univ Logist, Fac Logist, N-6410 Molde, Norway; [Mishra, Alok] Atilim Univ, Dept Software Engn, TR-06830 Ankara, Turkeyen_US
dc.descriptionKumar, Dr Sandeep/0000-0003-0747-6776; Kumar, Sandeep/0000-0002-3250-4866; Mishra, Alok/0000-0003-1275-2050; Kumar, Sandeep/0000-0001-9633-407Xen_US
dc.description.abstractThe early and accurate prediction of defects helps in testing software and therefore leads to an overall higher-quality product. Due to drift in software defect data, prediction model performances may degrade over time. Very few earlier works have investigated the significance of concept drift (CD) in software-defect prediction (SDP). Their results have shown that CD is present in software defect data and tha it has a significant impact on the performance of defect prediction. Motivated from this observation, this paper presents a paired learner-based drift detection and adaptation approach in SDP that dynamically adapts the varying concepts by updating one of the learners in pair. For a given defect dataset, a subset of data modules is analyzed at a time by both learners based on their learning experience from the past. A difference in accuracies of the two is used to detect drift in the data. We perform an evaluation of the presented study using defect datasets collected from the SEACraft and PROMISE data repositories. The experimentation results show that the presented approach successfully detects the concept drift points and performs better compared to existing methods, as is evident from the comparative analysis performed using various performance parameters such as number of drift points, ROC-AUC score, accuracy, and statistical analysis using Wilcoxon signed rank test.en_US
dc.identifier.citation3
dc.identifier.doi10.3390/app11146663
dc.identifier.issn2076-3417
dc.identifier.issue14en_US
dc.identifier.scopus2-s2.0-85111559250
dc.identifier.urihttps://doi.org/10.3390/app11146663
dc.identifier.urihttps://hdl.handle.net/20.500.14411/1996
dc.identifier.volume11en_US
dc.identifier.wosWOS:000675935700001
dc.identifier.wosqualityQ2
dc.institutionauthorMıshra, Alok
dc.language.isoenen_US
dc.publisherMdpien_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectconcept driften_US
dc.subjectnaive Bayesen_US
dc.subjectrandom foresten_US
dc.subjectsoftware defect predictionen_US
dc.subjectsoftware quality assuranceen_US
dc.titleA Paired Learner-Based Approach for Concept Drift Detection and Adaptation in Software Defect Predictionen_US
dc.typeArticleen_US
dspace.entity.typePublication
relation.isAuthorOfPublicationde97bc0b-032d-4567-835e-6cd0cb17b98b
relation.isAuthorOfPublication.latestForDiscoveryde97bc0b-032d-4567-835e-6cd0cb17b98b
relation.isOrgUnitOfPublicationd86bbe4b-0f69-4303-a6de-c7ec0c515da5
relation.isOrgUnitOfPublication.latestForDiscoveryd86bbe4b-0f69-4303-a6de-c7ec0c515da5

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