Measuring the Reusable Quality for Xml Schema Documents

dc.authoridMisra, Sanjay/0000-0002-3556-9331
dc.authorwosidMisra, Sanjay/K-2203-2014
dc.contributor.authorThaw, Tinzar
dc.contributor.authorMisra, Sanjay
dc.contributor.otherDepartment of English Language and Literature
dc.date.accessioned2024-10-06T10:59:29Z
dc.date.available2024-10-06T10:59:29Z
dc.date.issued2013
dc.departmentAtılım Universityen_US
dc.department-temp[Thaw, Tinzar] Univ Comp Studies, POB 73 22, Patheingyi Township, Mandalay, Myanmar; [Misra, Sanjay] Atilim Univ, Dept Comp Engn, TR-06836 Ankara, Turkeyen_US
dc.descriptionMisra, Sanjay/0000-0002-3556-9331en_US
dc.description.abstracteXtensible Markup Language (XML) based web applications are widely used for data describing and providing internet services. The design of XML schema document (XSD) needs to be quantified with software with the reusable nature of XSD. This nature of documents helps software developers to produce software at a lower software development cost. This paper proposes a metric Entropy. Measure of Complexity (EMC), which is intended to measure the reusable quality of XML schema documents. A higher EMC value tends to more reusable quality, and as well, a higher EMC value implies that this schema document contains inheritance feature, elements and attributes. For empirical validation, the metric is applied on 70 WSDL schema files. A comparison with similar measures is also performed. The proposed EMC metric is also validated practically and theoretically. Empirical, theoretical and practical validation and a comparative study proves that the EMC metric is a valid metric and capable of measuring the reusable quality of XSD.en_US
dc.description.woscitationindexScience Citation Index Expanded
dc.identifier.citationcount0
dc.identifier.endpage106en_US
dc.identifier.issn1785-8860
dc.identifier.issue4en_US
dc.identifier.pmid36561252
dc.identifier.scopusqualityQ1
dc.identifier.startpage87en_US
dc.identifier.volume10en_US
dc.identifier.wosWOS:000324562800005
dc.identifier.wosqualityQ3
dc.institutionauthorAras, Gökşen
dc.language.isoenen_US
dc.publisherBudapest Techen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectXMLen_US
dc.subjectXSDen_US
dc.subjectWSDLen_US
dc.subjectSoftware Metricsen_US
dc.subjectEntropyen_US
dc.titleMeasuring the Reusable Quality for Xml Schema Documentsen_US
dc.typeArticleen_US
dc.wos.citedbyCount0
dspace.entity.typePublication
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