Hot aluminum substrate induced hexagonal-tetragonal phase transitions in InSe and performance of Al/InSe/Cu<sub>2</sub>O <i>pn</i> tunneling devices

dc.authoridQasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid6603962677
dc.authorscopusid56766039000
dc.authorwosidQasrawi, Atef Fayez/R-4409-2019
dc.contributor.authorQasrawi, Atef Fayez
dc.contributor.authorKmail, Reham Reda
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T15:39:35Z
dc.date.available2024-07-05T15:39:35Z
dc.date.issued2020
dc.departmentAtılım Universityen_US
dc.department-temp[Qasrawi, Atef Fayez; Kmail, Reham Reda] Arab Amer Univ, Dept Phys, Jenin, Palestine; [Qasrawi, Atef Fayez] Atilim Univ, Dept Phys, Ankara, Turkeyen_US
dc.descriptionQasrawi, Atef Fayez/0000-0001-8193-6975en_US
dc.description.abstractIn the current study, we have considered the induced phase transitions in Al/InSe thin film substrates and employing them for fabrication of InSe/Cu2O tunneling channels. The InSe substrates are observed to prefer the transition from the hexagonal gamma-In(2)Se(3)to the rarely observed tetragonal InSe. The phase transitions are obtained by the thermally assisted diffusion of aluminum, which was already kept at 250 degrees C in a vacuum media of 10(-5)mbar before the compensation of InSe. The tetragonal InSe also induced the crystallization of orthorhombic Cu2O with acceptable level of lattice matching along thea-axis. The Al/InSe/Cu2O/Au heterojunctions, which are electrically analyzed are observed to exhibit rectifying features with the current conduction being dominated by electric fields assisted thermionic emission (tunneling) through a barrier of width of 5.5 to 14.0 nm and barrier height of 0.19 to 0.30 eV. The ac analyses of the capacitance and conductance spectra of this device have shown that it can exhibit high/low capacitance and frequency dependent conductance switching modes at 0.12 GHz in addition to negative capacitance effect in the range of 0.12 to 1.80 GHz. The features of the device are promising as they indicate the suitability of the device for fabrication of field effect transistors, memory devices, and ultrafast switches.en_US
dc.description.sponsorshipArab American University of Jenin [Cycle I 2019-2020]en_US
dc.description.sponsorshipArab American University of Jenin, Grant/Award Number: Cycle I 2019-2020en_US
dc.identifier.citationcount3
dc.identifier.doi10.1002/mop.32542
dc.identifier.endpage3856en_US
dc.identifier.issn0895-2477
dc.identifier.issn1098-2760
dc.identifier.issue12en_US
dc.identifier.scopus2-s2.0-85089785137
dc.identifier.startpage3848en_US
dc.identifier.urihttps://doi.org/10.1002/mop.32542
dc.identifier.urihttps://hdl.handle.net/20.500.14411/3240
dc.identifier.volume62en_US
dc.identifier.wosWOS:000562170300001
dc.identifier.wosqualityQ4
dc.institutionauthorQasrawı, Atef Fayez Hasan
dc.language.isoenen_US
dc.publisherWileyen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount3
dc.subjectAlen_US
dc.subjectInSeen_US
dc.subjectCu2Oen_US
dc.subjectnegative capacitance effecten_US
dc.subjectphase transitionsen_US
dc.subjecttunneling diodesen_US
dc.titleHot aluminum substrate induced hexagonal-tetragonal phase transitions in InSe and performance of Al/InSe/Cu<sub>2</sub>O <i>pn</i> tunneling devicesen_US
dc.typeArticleen_US
dc.wos.citedbyCount3
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery1138e68c-e06a-4ee2-a5ec-1dd89a3ecc2c
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