Physical Characterization of Thermally Evaporated Sn-Sb Thin Films for Solar Cell Applications

dc.authorid SURUCU, Özge/0000-0002-8478-1267
dc.authorscopusid 57394198200
dc.authorscopusid 57222350312
dc.authorscopusid 57193666915
dc.authorscopusid 7003589218
dc.authorwosid SURUCU, Özge/ABA-4839-2020
dc.contributor.author Bektas, Tunc
dc.contributor.author Surucu, Ozge
dc.contributor.author Terlemezoglu, Makbule
dc.contributor.author Parlak, Mehmet
dc.contributor.other Electrical-Electronics Engineering
dc.date.accessioned 2024-07-05T15:25:14Z
dc.date.available 2024-07-05T15:25:14Z
dc.date.issued 2023
dc.department Atılım University en_US
dc.department-temp [Bektas, Tunc; Parlak, Mehmet] Middle East Tech Univ, Dept Phys, TR-06800 Ankara, Turkiye; [Bektas, Tunc; Surucu, Ozge] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkiye; [Terlemezoglu, Makbule] Gazi Univ, Dept Phys, TR-06560 Ankara, Turkiye; [Parlak, Mehmet] Middle East Tech Univ, Ctr Solar Energy Res & Applicat GUNAM, TR-06800 Ankara, Turkiye en_US
dc.description SURUCU, Özge/0000-0002-8478-1267 en_US
dc.description.abstract The substitution of Sb in binary SnSe structure may lead to tailoring the physical properties of both SnSe and SbSe, promising absorber layers for thin film solar cells. The resulting Sn-Sb-Se structure could be an outstanding material for photovoltaic applications. In this study, Sn-Sb-Se thin films were deposited by thermal evaporation, and the effect of annealing on the films' structural, optical, and electrical properties were reported. XRD measurement shows that annealing at 300 degrees C yields the best crystalline quality, and structural parameters were calculated using XRD data. SEM and AFM measurements indicate deformation in the film surface after annealing at 400 degrees C. UV-Vis spectroscopy measurement provides a high absorption coefficient which indicates a direct band gap. The band gap and activation energies of the as-grown sample were found as 1.59 eV and 106.1 meV, respectively. The results of SEM, AFM, XRD, Raman, UV-Vis spectroscopy and temperature-dependent photoconductivity measurements were discussed throughout the paper. en_US
dc.description.sponsorship Turkish Scientific and Research Council (TUBITAK) [120F286] en_US
dc.description.sponsorship AcknowledgementsThis work has been supported by Turkish Scientific and Research Council (TUBITAK) under Grant no 120F286. en_US
dc.identifier.citationcount 1
dc.identifier.doi 10.1007/s00339-023-06656-4
dc.identifier.issn 0947-8396
dc.identifier.issn 1432-0630
dc.identifier.issue 5 en_US
dc.identifier.scopus 2-s2.0-85156109127
dc.identifier.uri https://doi.org/10.1007/s00339-023-06656-4
dc.identifier.uri https://hdl.handle.net/20.500.14411/2523
dc.identifier.volume 129 en_US
dc.identifier.wos WOS:000979558600001
dc.identifier.wosquality Q2
dc.institutionauthor Sürücü, Özge
dc.language.iso en en_US
dc.publisher Springer Heidelberg en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 3
dc.subject Sn-Sb-Se en_US
dc.subject Thin film en_US
dc.subject Annealing en_US
dc.subject Characterization en_US
dc.title Physical Characterization of Thermally Evaporated Sn-Sb Thin Films for Solar Cell Applications en_US
dc.type Article en_US
dc.wos.citedbyCount 3
dspace.entity.type Publication
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