Characterization of P-in<sub>2</Sub>se<sub>3< Thin Films
dc.authorid | parlak, mehmet/0000-0001-9542-5121 | |
dc.authorid | Qasrawi, Atef Fayez/0000-0001-8193-6975 | |
dc.authorscopusid | 6603962677 | |
dc.authorscopusid | 7003589218 | |
dc.authorscopusid | 6602475990 | |
dc.authorscopusid | 7006777039 | |
dc.authorwosid | Erçelebi, Çiğdem/ABB-8650-2020 | |
dc.authorwosid | parlak, mehmet/ABB-8651-2020 | |
dc.authorwosid | Qasrawi, Atef Fayez/R-4409-2019 | |
dc.contributor.author | Qasrawi, AF | |
dc.contributor.author | Parlak, M | |
dc.contributor.author | Erçelebi, Ç | |
dc.contributor.author | Günal, I | |
dc.contributor.other | Department of Electrical & Electronics Engineering | |
dc.date.accessioned | 2024-07-05T15:09:01Z | |
dc.date.available | 2024-07-05T15:09:01Z | |
dc.date.issued | 2001 | |
dc.department | Atılım University | en_US |
dc.department-temp | Atilim Univ, Fac Engn, TR-06836 Ankara, Turkey; Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkey | en_US |
dc.description | parlak, mehmet/0000-0001-9542-5121; Qasrawi, Atef Fayez/0000-0001-8193-6975 | en_US |
dc.description.abstract | Indium selenide thin films were deposited onto glass substrates kept at 150 degreesC by thermal evaporation of alpha -In2Se3. Some of the films were annealed at 150 degreesC and 200 degreesC and they all were found to exhibit p-type conductivity without intentional doping. Scanning electron microscopy (SEM) established that the films have an atomic content of In51Se49. X-ray diffraction (XRD) indicated that the as-grown films were amorphous in nature and became polycrystalline \beta-In2Se3 films after annealing. The analysis of conductivity temperature-dependence measurements in the range 320-100 K revealed that thermal excitation and thermionic emission of the carriers are the predominant conduction mechanisms above 200 K in the amorphous and polycrystalline samples, respectively. The carrier transport below 200 K is due to variable range hopping in all the samples. Hall measurements revealed that the mobility of the polycrystalline films is limited by the scattering of the charged carriers through the grain boundaries above 200 K. (C) 2001 Kluwer Academic Publishers. | en_US |
dc.identifier.citationcount | 20 | |
dc.identifier.doi | 10.1023/A:1012247618073 | |
dc.identifier.endpage | 476 | en_US |
dc.identifier.issn | 0957-4522 | |
dc.identifier.issue | 8 | en_US |
dc.identifier.scopus | 2-s2.0-0035428619 | |
dc.identifier.startpage | 473 | en_US |
dc.identifier.uri | https://doi.org/10.1023/A:1012247618073 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14411/1133 | |
dc.identifier.volume | 12 | en_US |
dc.identifier.wos | WOS:000171063900008 | |
dc.identifier.wosquality | Q2 | |
dc.institutionauthor | Qasrawı, Atef Fayez Hasan | |
dc.language.iso | en | en_US |
dc.publisher | Kluwer Academic Publ | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.scopus.citedbyCount | 20 | |
dc.subject | [No Keyword Available] | en_US |
dc.title | Characterization of P-in<sub>2</Sub>se<sub>3< Thin Films | en_US |
dc.type | Article | en_US |
dc.wos.citedbyCount | 20 | |
dspace.entity.type | Publication | |
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