Characterization of P-in<sub>2</Sub>se<sub>3< Thin Films

dc.authorid parlak, mehmet/0000-0001-9542-5121
dc.authorid Qasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid 6603962677
dc.authorscopusid 7003589218
dc.authorscopusid 6602475990
dc.authorscopusid 7006777039
dc.authorwosid Erçelebi, Çiğdem/ABB-8650-2020
dc.authorwosid parlak, mehmet/ABB-8651-2020
dc.authorwosid Qasrawi, Atef Fayez/R-4409-2019
dc.contributor.author Qasrawi, AF
dc.contributor.author Parlak, M
dc.contributor.author Erçelebi, Ç
dc.contributor.author Günal, I
dc.contributor.other Department of Electrical & Electronics Engineering
dc.date.accessioned 2024-07-05T15:09:01Z
dc.date.available 2024-07-05T15:09:01Z
dc.date.issued 2001
dc.department Atılım University en_US
dc.department-temp Atilim Univ, Fac Engn, TR-06836 Ankara, Turkey; Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkey en_US
dc.description parlak, mehmet/0000-0001-9542-5121; Qasrawi, Atef Fayez/0000-0001-8193-6975 en_US
dc.description.abstract Indium selenide thin films were deposited onto glass substrates kept at 150 degreesC by thermal evaporation of alpha -In2Se3. Some of the films were annealed at 150 degreesC and 200 degreesC and they all were found to exhibit p-type conductivity without intentional doping. Scanning electron microscopy (SEM) established that the films have an atomic content of In51Se49. X-ray diffraction (XRD) indicated that the as-grown films were amorphous in nature and became polycrystalline \beta-In2Se3 films after annealing. The analysis of conductivity temperature-dependence measurements in the range 320-100 K revealed that thermal excitation and thermionic emission of the carriers are the predominant conduction mechanisms above 200 K in the amorphous and polycrystalline samples, respectively. The carrier transport below 200 K is due to variable range hopping in all the samples. Hall measurements revealed that the mobility of the polycrystalline films is limited by the scattering of the charged carriers through the grain boundaries above 200 K. (C) 2001 Kluwer Academic Publishers. en_US
dc.identifier.citationcount 20
dc.identifier.doi 10.1023/A:1012247618073
dc.identifier.endpage 476 en_US
dc.identifier.issn 0957-4522
dc.identifier.issue 8 en_US
dc.identifier.scopus 2-s2.0-0035428619
dc.identifier.startpage 473 en_US
dc.identifier.uri https://doi.org/10.1023/A:1012247618073
dc.identifier.uri https://hdl.handle.net/20.500.14411/1133
dc.identifier.volume 12 en_US
dc.identifier.wos WOS:000171063900008
dc.identifier.wosquality Q2
dc.institutionauthor Qasrawı, Atef Fayez Hasan
dc.language.iso en en_US
dc.publisher Kluwer Academic Publ en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 20
dc.subject [No Keyword Available] en_US
dc.title Characterization of P-in<sub>2</Sub>se<sub>3< Thin Films en_US
dc.type Article en_US
dc.wos.citedbyCount 20
dspace.entity.type Publication
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relation.isOrgUnitOfPublication.latestForDiscovery c3c9b34a-b165-4cd6-8959-dc25e91e206b

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