Temperature effects on the optoelectronic properties of AgIn<sub>5</sub>S<sub>8</sub> thin films

dc.authoridQasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid6603962677
dc.authorwosidQasrawi, Atef Fayez/R-4409-2019
dc.contributor.authorQasrawi, A. F.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T15:10:30Z
dc.date.available2024-07-05T15:10:30Z
dc.date.issued2011
dc.departmentAtılım Universityen_US
dc.department-temp[Qasrawi, A. F.] Atilim Univ, Fac Engn, Grp Phys, TR-06836 Ankara, Turkey; [Qasrawi, A. F.] Arab Amer Univ, Dept Phys, Jenin, Israelen_US
dc.descriptionQasrawi, Atef Fayez/0000-0001-8193-6975en_US
dc.description.abstractPolycrystalline AgIn5S8 thin films are obtained by the thermal evaporation of AgIn5S8 crystals onto ultrasonically cleaned glass substrates under a pressure of similar to 1.3 x 10(-3) Pa. The temperature dependence of the optical band gap and photoconductivity of these films was studied in the temperature regions of 300-450 K and 40-300 K, respectively. The heat treatment effect at annealing temperatures of 350, 450 and 550 K on the temperature dependent photoconductivity is also investigated. The absorption coefficient, which was studied in the incidence photon energy range of 1.65-2.55 eV, increased with increasing temperature. Consistently, the absorption edge shifts to lower energy values as temperature increases. The fundamental absorption edge which corresponds to a direct allowed transition energy band gap of 1.78 eV exhibited a temperature coefficient of -3.56 x 10(-4) eV/K. The 0 K energy band gap is estimated as 1.89 eV. AgIn5S8 films are observed to be photoconductive. The highest and most stable temperature invariant photocurrent was obtained at an annealing temperature of 550 K. The photoconductivity kinetics was attributed to the structural modifications caused by annealing and due to the trapping-recombination centers' exchange. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.identifier.citationcount8
dc.identifier.doi10.1016/j.tsf.2010.12.153
dc.identifier.endpage3772en_US
dc.identifier.issn0040-6090
dc.identifier.issue11en_US
dc.identifier.scopus2-s2.0-79952736140
dc.identifier.startpage3768en_US
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2010.12.153
dc.identifier.urihttps://hdl.handle.net/20.500.14411/1330
dc.identifier.volume519en_US
dc.identifier.wosWOS:000289333400056
dc.identifier.wosqualityQ3
dc.institutionauthorQasrawı, Atef Fayez Hasan
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount9
dc.subjectThin filmsen_US
dc.subjectChalcogenide glassesen_US
dc.subjectOptical propertiesen_US
dc.subjectBand gapen_US
dc.subjectPhotoconductivityen_US
dc.subjectI-III-VI semiconductorsen_US
dc.titleTemperature effects on the optoelectronic properties of AgIn<sub>5</sub>S<sub>8</sub> thin filmsen_US
dc.typeArticleen_US
dc.wos.citedbyCount9
dspace.entity.typePublication
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