Illumination Effects on the Capacitance Spectra and Signal Quality Factor of Al/Inse Microwave Sensors

dc.authoridQasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid6603962677
dc.authorwosidQasrawi, Atef Fayez/R-4409-2019
dc.contributor.authorQasrawi, A. F.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T14:28:40Z
dc.date.available2024-07-05T14:28:40Z
dc.date.issued2013
dc.departmentAtılım Universityen_US
dc.department-temp[Qasrawi, A. F.] Arab Amer Univ, Dept Phys, Jenin, Israel; [Qasrawi, A. F.] Atilim Univ, Grp Phys, Fac Engn, TR-06836 Ankara, Turkeyen_US
dc.descriptionQasrawi, Atef Fayez/0000-0001-8193-6975en_US
dc.description.abstractAmorphous indium selenide thin films have been used in the design of a microwave-sensitive Schottky barrier. The illumination effects on the capacitance spectra, on the signal quality factor, and on the capacitance (C)-voltage (V) characteristics of the Al/InSe/C device are investigated. Particular shifts in the amplitude and in the resonance peaks of the capacitance spectra which were studied in the frequency range of 10.0 kHz to 3.0 GHz are observed. While the photoexcitation of these devices increased the capacity level by similar to 1.6 times the original magnitude, the dark quality factor, which was 2.2 x 10(6) at 3.0 GHz, fell to 1.2 x 10(6) when subjected to luminance of 14.7 klux. Analysis of the C-V curves recorded at signal power ranging from wireless local area network (LAN) levels to the maximum output power of third generation (3G) mobiles reflected high tunability of capacitance upon increasing the voltage or power. The tunability of the biased capacitance was much more pronounced in the light than in the dark. The obtained characteristics of the Al/InSe/C sensors indicate their usability in radio and microwave technology.en_US
dc.identifier.citationcount7
dc.identifier.doi10.1007/s11664-013-2502-6
dc.identifier.endpage1036en_US
dc.identifier.issn0361-5235
dc.identifier.issue6en_US
dc.identifier.scopus2-s2.0-84877745758
dc.identifier.startpage1033en_US
dc.identifier.urihttps://doi.org/10.1007/s11664-013-2502-6
dc.identifier.urihttps://hdl.handle.net/20.500.14411/423
dc.identifier.volume42en_US
dc.identifier.wosWOS:000318569300014
dc.identifier.wosqualityQ3
dc.institutionauthorQasrawı, Atef Fayez Hasan
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount7
dc.subjectSemiconductor devicesen_US
dc.subjectInSeen_US
dc.subjectthin filmsen_US
dc.subjectopticalen_US
dc.titleIllumination Effects on the Capacitance Spectra and Signal Quality Factor of Al/Inse Microwave Sensorsen_US
dc.typeArticleen_US
dc.wos.citedbyCount7
dspace.entity.typePublication
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