Eryilmaz, SerkanEryılmaz, SerkanYalcin, FeminIndustrial Engineering2024-07-052024-07-05201150377-042710.1016/j.cam.2011.09.0132-s2.0-80955130703https://doi.org/10.1016/j.cam.2011.09.013https://hdl.handle.net/20.500.14411/1337Yalcin, Femin/0000-0003-0602-9392; Eryilmaz, Serkan/0000-0002-2108-1781This paper is concerned with the mean, minimum and maximum distances between two successive failures in a binary sequence consisting of Markov dependent elements. These random variables are potentially useful for the analysis of the frequency of critical events occurring in certain stochastic processes. Exact distributions of these random variables are derived via combinatorial techniques and illustrative numerical results are presented. (C) 2011 Elsevier B.V. All rights reserved.eninfo:eu-repo/semantics/closedAccessBinary sequenceExact distributionExtremesMarkov chainSystem reliabilityArticleQ1236615021510WOS:000298271800037