Chadjiconstantinidis, StathisEryilmaz, SerkanIndustrial Engineering2024-07-052024-07-05202400167-71521879-210310.1016/j.spl.2024.1100462-s2.0-85183930078https://doi.org/10.1016/j.spl.2024.110046https://hdl.handle.net/20.500.14411/2340In this paper, we study the reliability of a system that works under o-shock model. That is, the system failure occurs when the time between two successive shocks is less than a given threshold o. In a traditional setup of the o shock model, the intershock times are assumed to have the same distribution. In the present setup, a change occurs in the distribution of the intershock times due to an environmental effect. Thus, the distribution of the intershock times changes after a random number of shocks. The reliability of the system is studied under this change point setup.eninfo:eu-repo/semantics/closedAccessChange pointReliabilityShock modelMTTFDiscrete phase -type distributionArticleQ4208WOS:001176230300001