Parallel and Consecutive-k-out-of-n< Systems Under Stochastic Deterioration

Eryilmaz, SerkanIndustrial Engineering2024-07-052024-07-0520140096-30031873-564910.1016/j.amc.2013.10.0812-s2.0-84888633919https://doi.org/10.1016/j.amc.2013.10.081https://hdl.handle.net/20.500.14411/77Eryilmaz, Serkan/0000-0002-2108-1781In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD. (C) 2013 Elsevier Inc. All rights reserved.eninfo:eu-repo/semantics/closedAccessConsecutive-k-out-of-n:F systemDeteriorationMaximal signatureParallel systemReliabilityParallel and Consecutive-k-out-of-n< Systems Under Stochastic DeteriorationArticleQ12271926WOS:0003314964000035