Surucu, O.Surucu, G.Gasanly, N. M.Parlak, M.Isik, M.Electrical-Electronics EngineeringDepartment of Electrical & Electronics Engineering2024-09-102024-09-10202400167-577X1873-497910.1016/j.matlet.2024.1370782-s2.0-85200135458https://doi.org/10.1016/j.matlet.2024.137078https://hdl.handle.net/20.500.14411/7288SURUCU, Ozge/0000-0002-8478-1267; SURUCU, Gokhan/0000-0002-3910-8575This study examines CdTe thin films deposited via RF magnetron sputtering, focusing on structural and optical properties. X-ray diffraction, Raman spectroscopy, and SEM assessed structural characteristics. Optical properties were analyzed through transmittance measurements from 10 to 300 K. Tauc plots and Varshni modeling revealed a temperature-dependent bandgap, increasing from 1.49 eV at room temperature to 1.57 eV at 10 K. Urbach energy rose from 82.7 to 93.7 meV with temperature. These results are essential for applications where temperature affects CdTe-based device performance.eninfo:eu-repo/semantics/closedAccessThin FilmsSputteringOptical materials and propertiesSolar energy materialsArticleQ2Q2373WOS:001288608300001