Eryilmaz,S.Industrial Engineering2024-11-052024-11-052024978-146148033-4978-146148032-710.1007/978-1-4614-8033-4_662-s2.0-85207216202https://doi.org/10.1007/978-1-4614-8033-4_66https://hdl.handle.net/20.500.14411/10261This chapter summarizes the close connection between one of the widely studied shock models known as δ-shock model and runs/scans. Under discrete time setting, i.e., when the shocks occur according to a binomial process, the linkage between the lifetime of the system under the shock model and the waiting time for the first scan is presented. Such a useful connection may create a new perspective to study the reliability properties of the system under the δ-shock model. © Springer Science+Business Media, LLC, part of Springer Nature 2024.eninfo:eu-repo/semantics/closedAccessReliabilityRunsScansShock modelBook PartN/AN/A569574