Delice, S.Isik, M.Gasanly, N. M.Department of Electrical & Electronics Engineering2024-07-052024-07-0520240973-14580974-984510.1007/s12648-024-03163-x2-s2.0-85189200728https://doi.org/10.1007/s12648-024-03163-xhttps://hdl.handle.net/20.500.14411/2243Temperature dependency of band gap in CuO nano thin films has been investigated by virtue of transmission experiments at different temperatures. Structural and morphological characterization were achieved using X-ray diffraction (XRD) and scanning electron microscopy (SEM) measurements. Analysis on the XRD diffractogram revealed the presence of monoclinic structure for the CuO. Average crystallite size was determined as 17.8 nm. Absorption characteristics in between 10 and 300 K were presented in the wavelength range of 360-1100 nm. The band gap of the CuO was found to be similar to 2.17 eV at 300 K using Tauc and spectral derivative methods. This value increased to similar to 2.24 eV at 10 K. Both methods showed that the band gap extended with decreasing temperature. Temperature dependency of the band gap was studied using Varshni relation. The band gap at absolute temperature, variation of the band gap with temperature and Debye temperature were calculated as 2.242 +/- 0.002 eV, - 5.4 +/- 0.2 x 10(-4) eV/K and 394 +/- 95 K, respectively.eninfo:eu-repo/semantics/closedAccessOxidesCopper (II) oxideOptical propertiesNanoparticlesOptoelectronicsArticleWOS:0011954145000030