166 results
Search Results
Now showing 1 - 10 of 166
Article Citation - WoS: 2Citation - Scopus: 2Space-charge-limited currents and photoconductive properties of Tl2InGaSe4 layered crystals(Taylor & Francis Ltd, 2008) Qasrawi, A. F.; Gasanly, N. M.The extrinsic electronic parameters of Tl2InGaSe4 layered crystals were investigated through measurement of the temperature-dependent dark conductivity, space-charge-limited currents and photoconductivity. Analysis of the dark conductivity reveals the existence of two extrinsic energy levels at 0.40 and 0.51 eV below the conduction band edge, which are dominant above and below 260 K, respectively. Current-voltage characteristics show that the one at 0.51 eV is a trapping energy level with a concentration of (4.8-7.7) x 10(10) cm(3). Photoconductivity measurements reveal the existence of another energy level located at 0.16 eV. In the studied temperature range, the photocurrent increases with increasing temperature. The dependence of the photoconductivity on the incident light intensity exhibits a linear recombination character near room temperature and a supralinear character as the temperature decreases. The change in recombination mechanism is attributed to an exchange in the behavior of sensitizing and recombination centres.Article Citation - WoS: 9Citation - Scopus: 9Thermally Stimulated Current Measurements in Undoped Ga3inse4< Single Crystals(Pergamon-elsevier Science Ltd, 2011) Isik, M.; Işık, Mehmet; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringThe trap levels in nominally undoped Ga3InSe4 crystals were investigated in the temperature range of 10-300 K using the thermally stimulated currents technique. The study of trap levels was accomplished by the measurements of current flowing along the c-axis of the crystal. During the experiments we utilized a constant heating rate of 0.8 K/s. Experimental evidence is found for one hole trapping center in the crystal with activation energy of 62 meV. The analysis of the experimental TSC curve gave reasonable results under the model that assumes slow retrapping. The capture cross-section of the trap was determined as 1.0 x 10(-25) cm(2) with concentration of 1.4 x 10(17) cm(-3). (C) 2011 Elsevier Ltd. All rights reserved.Article Citation - WoS: 5Citation - Scopus: 5Structural and Optical Properties of Thermally Evaporated (gase)0.75-(gas)0.25 Thin Films(Elsevier Gmbh, 2021) Isik, M.; Işık, Mehmet; Emir, C.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringGaSe and GaS binary semiconducting compounds are layered structured and have been an attractive research interest in two-dimensional material research area. The present paper aims at growing (GaSe)0.75 - (GaS)0.25 (or simply GaSe0.75S0.25) thin film and investigating its structural and optical properties. Thin films were prepared by thermal evaporation technique using evaporation source of its single crystal grown by Bridgman method. The structural properties were revealed using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. XRD pattern and EDS analyses indicated that thin films annealed at 300 ?C were successfully deposited and its structural characteristics are well-consistent with its single crystal form. Surface morphology was studied by means of SEM and AFM measurements. Optical properties were investigated by transmission and Raman spectroscopy techniques. Raman spectrum exhibited three peaks around 172, 242 and 342 cm-1. Analyses of transmission spectrum revealed the direct band gap energy as 2.34 eV. The mixed compounds of GaSe0.75S0.25 were prepared for the first time in a thin film form and the results of the present paper would provide valuable information to research area in which layered compounds have been studied in detail.Article Citation - WoS: 19Citation - Scopus: 19Temperature-Dependent Band Gap Characteristics of Bi12sio20< Single Crystals(Amer inst Physics, 2019) Isik, M.; Delice, S.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Bi12SiO20 single crystals have attracted interest due to their remarkable photorefractive characteristics. Since bandgap and refractive index are related theoretically to each other, it takes much attention to investigate temperature dependency of bandgap energy to understand the behavior of photorefractive crystals. The present study aims at investigating structural and optical characteristics of photorefractive Bi12SiO20 single crystals grown by the Czochralski method. The structural characterization methods indicated that atomic composition ratios of constituent elements were well-matched with the chemical compound Bi12SiO20, and grown crystals have a cubic crystalline structure. Optical properties of crystals were investigated by room temperature Raman spectroscopy and temperature-dependent transmission measurements between 10 and 300 K. The analyses of transmittance spectra by absorption coefficient and derivative spectrophotometry techniques resulted in energy bandgaps decreasing from 2.61 to 2.48 eV and 2.64 to 2.53 eV as temperature was increased from 10 to 300 K. The Varshni model was applied to analyze temperature-bandgap energy dependency.Article Citation - WoS: 5Citation - Scopus: 6Photoelectronic and Electrical Properties of Tl2ingas4< Layered Crystals(Pergamon-elsevier Science Ltd, 2007) Qasrawi, A. F.; Gasanly, N. M.Tl2InGaS4 layered crystals are studied through the dark electrical conductivity, space charge limited current and illumination- and temperature-dependent photoconductivity measurements in the temperature regions of 220-350 K, 300-400 K and 200-350 K, respectively. The space charge limited current measurements revealed the existence of a single discrete trapping level located at 0.44 eV. The dark electrical conductivity showed the existence of two energy levels of 0.32 eV and 0.60 eV being dominant above and below 300 K, respectively. The photoconductivity measurements reflected the existence of two other energy levels located at 0.28 eV and 0.19 eV at high and low temperatures, respectively. The photocurrent is observed to increase with increasing temperature up to a maximum temperature of 330 K. The illumination dependence of photoconductivity is found to exhibit supralinear recombination in all the studied temperature ranges. The change in recombination mechanism is attributed to exchange in the behavior of sensitizing and recombination centers. (C) 2006 Elsevier Ltd. All rights reserved.Article Citation - WoS: 5Citation - Scopus: 5Low-Temperature Thermoluminescence in Layered Structured Ga0.75in0.25< Single Crystals(Elsevier Science Sa, 2012) Isik, M.; Bulur, E.; Gasanly, N. M.Defect centers in Ga0.75In0.25Se single crystals have been studied performing the thermoluminescence measurements in the temperature range of 10-300 K. The observed glow curves were analyzed using curve fitting, initial rise, and different heating rate methods to determine the activation energies of the defect centers. Thermal cleaning process has been applied to decompose the overlapped curves. Four defect centers with activation energies of 9, 45,54 and 60 meV have been found as a result of the analysis. The capture cross sections and attempt-to-escape frequencies of the defect centers were also found using the curve fitting method under the light of theoretical predictions. The first order kinetics for the observed glow curve was revealed from the consistency between the theoretical predictions for slow retrapping and experimental results. Another indication of negligible retrapping was the independency of peak position from concentration of carriers trapped in defect levels. (C) 2012 Elsevier B.V. All rights reserved.Article Citation - WoS: 7Citation - Scopus: 6Temperature-Dependent Structural Transition, Electronic Properties and Impedance Spectroscopy Analysis of Tl2ingas4< Crystals Grown by the Bridgman Method(Elsevier Sci Ltd, 2018) Qasrawi, A. F.; Alkarem, Qotaibah A.; Gasanly, N. M.In this work, we report the temporary structural modifications associated with the in situ heating of the Tl2InGaS4 crystals in the temperature range of 300-420 K. The analysis of the X-ray diffraction patterns revealed the temperature-independent possible phase transformations between the monoclinic and triclinic phases. The temperature analysis of the lattice parameters, crystallite size, strain, dislocation density and stacking faults has shown a temporary enhancement in the crystallinity of this compound above 375 K. Significant increase in the grain size accompanied to decrease in the strain, defect density and stacking faults was observed above this temperature. The scanning electron microscopy imaging has shown that the crystals are layer structured with high quality layers of thicknesses of similar to 12 nm. In addition the energy dispersive X-ray analysis has shown that the crystal comprise no detectable impurity. Moreover, the room temperature optical characterizations has shown that the Tl2InGaS4 exhibit an energy band gap of 2.5 eV. The temperature dependent electrical resistivity measurements indicated highly resistive crystal with activation energy values of 0.84 and 0.19 eV above and below 375 K, respectively. On the other hand, room temperature impedance spectroscopy analysis in the frequency domain of 10-1800 MHz has shown that the crystal exhibits negative resistance and negative capacitance effects below and above 1580 MHz. The crystals are observed also to behave as band stop filter with notch frequency of 1711 MHz.Article Citation - WoS: 4Citation - Scopus: 4Mixed Conduction and Anisotropic Single Oscillator Parameters in Low Dimensional Tlinse2 Crystals(Elsevier Science Sa, 2013) Qasrawi, A. F.; Gasanly, N. M.Due to the importance of the TlInSe2 crystal as neutron and gamma-ray detectors, its electrical and dispersive optical parameters have been investigated. Particularly, the anisotropic current conduction mechanism in the temperature region of 100-350 K and the room temperature anisotropic dispersive optical properties were studied by means of electrical conductivity and optical reflectance, respectively. It has been shown that the mixed conduction is the most dominant transport mechanism in the TlInSe2 crystals. Particularly, when the electric field is applied perpendicular to the crystal's c-axis, the main dominant current transport mechanism is due to the mixed conduction and the variable range hopping above and below 160 K, respectively. When the electric field is applied parallel to the crystal's c-axis, the electrical conductivity is dominated by the thermionic emission, mixed conduction and variable range hopping at high, moderate and low temperatures, respectively. The optical reflectivity analysis in the wavelength range 210-1500 nm revealed a clear anisotropy effect on the dispersive optical parameters. Particularly, the static refractive index, static dielectric constant, dispersion energy and oscillator energy exhibited values of 2.50, 6.24, 20.72 eV and 3.96 eV, and values of 3.05, 9.33, 39.27 eV and 4.72 eV for light propagation parallel and perpendicular to the crystal's c-axis, respectively. Moreover, the frequency dependence of the dielectric constant, epsilon(omega), reflected strong dielectric anisotropy that exhibit maximum epsilon(omega) value of 38.80 and 11.40 at frequencies of 11.07 x 10(14) Hz for light propagation parallel and perpendicular to the crystal's c-axis, respectively. The anisotropy in the epsilon(omega) makes the TlInSe2 crystals attractive to be used as nonvolatile static memory devices. (C) 2013 Elsevier B.V. All rights reserved.Article Citation - WoS: 3Citation - Scopus: 4Optical Properties of Cu3in5< Single Crystals by Spectroscopic Ellipsometry(Elsevier Gmbh, 2018) Isik, M.; Nasser, H.; Ahmedova, F.; Guseinov, A.; Gasanly, N. M.Cu3In5S9 single crystals were investigated by structural methods of x-ray diffraction and energy dispersive spectroscopy and optical techniques of ellipsometry and reflection carried out at room temperature. The spectral dependencies of optical constants; dielectric function, refractive index and extinction coefficient, were plotted in the range of 1.2-6.2 eV from ellipsometric data. The spectra of optical constants obtained from ellipsometry analyses and reflectance spectra presented a sharp change around 1.55 and 1.50 eV, respectively, which are associated with band gap energy of the crystal. The critical point (interband transition) energies were also found from the analyses of second-energy derivative of real and imaginary components of dielectric function. The analyses indicated the presence of four critical points at 2.73, 135, 4.04 and 4.98 eV.Article Citation - WoS: 14Citation - Scopus: 14Low Temperature Thermoluminescence Behaviour of Y2o3< Nanoparticles(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.Y2O3 nanoparticles were investigated using low temperature thermoluminescence (TL) experiments. TL glow curve recorded at constant heating rate of 0.4 K/s exhibits seven peaks around 19, 62, 91, 115, 162, 196 and 215 K. Activation energies and characteristics of traps responsible for observed curves were revealed under the light of results of initial rise analyses and T-max-T-stop experimental methods. Analyses of TL curves obtained at different stopping temperatures resulted in presence of one quasi-continuously distributed trap with activation energies increasing from 18 to 24 meV and six single trapping centers at 49, 117, 315, 409, 651 and 740 meV. Activation energies of all revealed centers were reported in the present paper. Structural characterization of Y2O3 nanoparticles was accomplished using X-ray diffraction and scanning electron microscopy measurements. (C) 2019 Chinese Society of Rare Earths. Published by Elsevier B.V. All rights reserved.
