Numerical and experimental analysis of transverse electromagnetic cell

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Date

2016

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Wiley

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Department of Electrical & Electronics Engineering
Department of Electrical and Electronics Engineering (EE) offers solid graduate education and research program. Our Department is known for its student-centered and practice-oriented education. We are devoted to provide an exceptional educational experience to our students and prepare them for the highest personal and professional accomplishments. The advanced teaching and research laboratories are designed to educate the future workforce and meet the challenges of current technologies. The faculty's research activities are high voltage, electrical machinery, power systems, signal and image processing and photonics. Our students have exciting opportunities to participate in our department's research projects as well as in various activities sponsored by TUBİTAK, and other professional societies. European Remote Radio Laboratory project, which provides internet-access to our laboratories, has been accomplished under the leadership of our department with contributions from several European institutions.

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Abstract

A transverse electromagnetic (TEM) Cell is able to generate accurate electromagnetic waves from 0 Hz to several MHz. Using this device, Electromagnetic Interference/Compatibility (EMI/EMC) tests of small RF devices can be performed in a regular laboratory environment. Before invention of the TEM Cell, an anechoic chamber environment was needed to perform EMI/EMC tests. However, this approach is costly and restrictive. Using a TEM Cell, it is much less expensive and time consuming. During this study, open and close models of TEM Cells were designed. One of the models was manufactured and tested. Simulation and measurement results were compared with observe the challenges of the study. (c) 2016 Wiley Periodicals, Inc. Int J RF and Microwave CAE 26:373-378, 2016.

Description

Çalışkan, Fatma/0000-0002-9772-5117

Keywords

transverse electromagnetic (TEM) Cell, TEM Cell design, EMI, EMC tests

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1

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Volume

26

Issue

4

Start Page

373

End Page

378

URI

https://doi.org/10.1002/mmce.20985
 https://hdl.handle.net/20.500.14411/516

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