The Reliability of EBSD-Based Microstructure Analysis
The Reliability of EBSD-Based Microstructure Analysis
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Özet
Kemal Davut, Stefan Zaefferer; The Reliability of EBSD-based Microstructure Analysis, Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pag
Açıklama
Anahtar kelimeler
Metallurgy, Microstructure, Electron Backscatter Diffraction, Materials Science, Reliability (Semiconductor)
Bilim Dalları
0301 basic medicine, 0303 health sciences, 03 medical and health sciences
Alıntı
WoS Q
Scopus Q
Cilt
21
Sayı
S3
Başlangıç Sayfası
2029
Bitiş Sayfası
2030
Koleksiyonlar
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