Statistical Randomness Tests of Long Sequences by Dynamic Partitioning

dc.contributor.author Akcengiz, Ziya
dc.contributor.author Asian, Melis
dc.contributor.author Karabayir, Ozgur
dc.contributor.author Doganaksoy, Ali
dc.contributor.author Uguz, Muhiddin
dc.contributor.author Sulak, Fatih
dc.contributor.other Mathematics
dc.contributor.other 02. School of Arts and Sciences
dc.contributor.other 01. Atılım University
dc.date.accessioned 2024-07-05T15:41:19Z
dc.date.available 2024-07-05T15:41:19Z
dc.date.issued 2020
dc.description.abstract Random numbers have a wide usage in the area of cryptography. In practice, pseudo random number generators are used in place of true random number generators, as regeneration of them may be required. Therefore because of generation methods of pseudo random number sequences, statistical randomness tests have a vital importance. In this paper, a randomness test suite is specified for long binary sequences. In literature, there are many randomness tests and test suites. However, in most of them, to apply randomness test, long sequences are partitioned into a certain fixed length and the collection of short sequences obtained is evaluated instead. In this paper, instead of partitioning a long sequence into lixed length subsequences, a concept of dynamic partitioning is introduced in accordance with the random variable in consideration. Then statistical methods are applied. The suggested suite, containing four statistical tests: Collision Tests, Weight Test, Linear Complexity Test and Index Coincidence Test, all of them work with the idea of dynamic partitioning. Besides the adaptation of this approach to randomness tests, the index coincidence test is another contribution of this work. The distribution function and the application of all tests are given in the paper. en_US
dc.identifier.doi 10.1109/iscturkey51113.2020.9308005
dc.identifier.isbn 9780738125060
dc.identifier.uri https://doi.org/10.1109/iscturkey51113.2020.9308005
dc.identifier.uri https://hdl.handle.net/20.500.14411/3443
dc.language.iso en en_US
dc.publisher Ieee en_US
dc.relation.ispartof International Conference on Information Security and Cryptology (ISCTURKEY) -- DEC 03-04, 2020 -- ELECTR NETWORK en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Randomness en_US
dc.subject Random Number en_US
dc.subject Test Suites en_US
dc.subject NIST SP 800-22 en_US
dc.title Statistical Randomness Tests of Long Sequences by Dynamic Partitioning en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.institutional Sulak, Fatih
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gdc.description.department Atılım University en_US
gdc.description.departmenttemp [Akcengiz, Ziya] Sci & Tecnol Res Council Turkey, Natl Res Instutite Elect & Cryptol, Ankara, Turkey; [Asian, Melis; Karabayir, Ozgur; Doganaksoy, Ali; Uguz, Muhiddin] Middle East Tecn Univ, Dept Math, Ankara, Turkey; [Sulak, Fatih] Atilim Univ, Dept Math, Ankara, Turkey en_US
gdc.description.endpage 74 en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.startpage 68 en_US
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gdc.oaire.sciencefields 0211 other engineering and technologies
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gdc.oaire.sciencefields 01 natural sciences
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