Joint Distribution of Run Statistics in Partially Exchangeable Processes

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2011

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Elsevier Science Bv

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Industrial Engineering
(1998)
Industrial Engineering is a field of engineering that develops and applies methods and techniques to design, implement, develop and improve systems comprising of humans, materials, machines, energy and funding. Our department was founded in 1998, and since then, has graduated hundreds of individuals who may compete nationally and internationally into professional life. Accredited by MÜDEK in 2014, our student-centered education continues. In addition to acquiring the knowledge necessary for every Industrial engineer, our students are able to gain professional experience in their desired fields of expertise with a wide array of elective courses, such as E-commerce and ERP, Reliability, Tabulation, or Industrial Engineering Applications in the Energy Sector. With dissertation projects fictionalized on solving real problems at real companies, our students gain experience in the sector, and a wide network of contacts. Our education is supported with ERASMUS programs. With the scientific studies of our competent academic staff published in internationally-renowned magazines, our department ranks with the bests among other universities. IESC, one of the most active student networks at our university, continues to organize extensive, and productive events every year.

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Abstract

Let {X-i}(i >= 1) be an infinite sequence of recurrent partially exchangeable random variables with two possible outcomes as either "1" (success) or "0" (failure). In this paper we obtain the joint distribution of success and failure run statistics in {X-i}(i >= 1). The results can be used to obtain the joint distribution of runs in ordinary Markov chains, exchangeable and independent sequences. (C) 2010 Elsevier B.V. All rights reserved.

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Eryilmaz, Serkan/0000-0002-2108-1781
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Keywords

de Finetti representation, Exchangeability, Partial exchangeability, Runs, Start-up demonstration tests

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Q4

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Volume

81

Issue

1

Start Page

163

End Page

168

URI

https://doi.org/10.1016/j.spl.2010.10.014
 https://hdl.handle.net/20.500.14411/1574

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