Infrared Absorption Spectroscopy of Monolayers with Thin Film Interference Coatings

dc.authorid Celebi, Kemal/0009-0007-9402-1716
dc.authorwosid Celebi, Kemal/C-6732-2009
dc.contributor.author Ayas, Sencer
dc.contributor.author Bakan, Gokhan
dc.contributor.author Ozgur, Erol
dc.contributor.author Celebi, Kemal
dc.contributor.author dana, Aykutlu
dc.contributor.other Department of Electrical & Electronics Engineering
dc.date.accessioned 2024-10-06T11:12:06Z
dc.date.available 2024-10-06T11:12:06Z
dc.date.issued 2017
dc.department Atılım University en_US
dc.department-temp [Ayas, Sencer; Bakan, Gokhan; Ozgur, Erol; Celebi, Kemal; dana, Aykutlu] Bilkent Univ, Inst Mat Sci & Nanotechnol, UNAM, TR-06800 Ankara, Turkey; [Ayas, Sencer] Stanford Univ, Dept Radiol, Canary Ctr Stanford Canc Early Defect, Stanford, CA 94305 USA; [Bakan, Gokhan] Atilim Univ, Dept Elect & Elect Engn, TR-06830 Ankara, Turkey en_US
dc.description Celebi, Kemal/0009-0007-9402-1716 en_US
dc.description.abstract We report high performance Infrared spectroscopy platforms based on interference coatings on metal using CaF2 dielectric films and Ge2Sb2Te5 (GST) phase-change films. IR vibrational bands of proteins and organic monolayers are also detected. en_US
dc.description.woscitationindex Conference Proceedings Citation Index - Science
dc.identifier.citationcount 0
dc.identifier.isbn 9781943580279
dc.identifier.issn 2160-9020
dc.identifier.scopusquality N/A
dc.identifier.uri https://hdl.handle.net/20.500.14411/9111
dc.identifier.wos WOS:000427296201327
dc.identifier.wosquality N/A
dc.institutionauthor Bakan, Gökhan
dc.language.iso en en_US
dc.publisher Ieee en_US
dc.relation.ispartof Conference on Lasers and Electro-Optics (CLEO) -- MAY 14-19, 2017 -- San Jose, CA en_US
dc.relation.ispartofseries Conference on Lasers and Electro-Optics
dc.relation.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject [No Keyword Available] en_US
dc.title Infrared Absorption Spectroscopy of Monolayers with Thin Film Interference Coatings en_US
dc.type Conference Object en_US
dc.wos.citedbyCount 0
dspace.entity.type Publication
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